Application of electrochemical atomic force microscopy

被引:0
作者
Li, XJ
He, PG
Fang, YX [1 ]
Hu, J
Li, MQ
机构
[1] E China Normal Univ, Dept Chem, Shanghai 200062, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Nucl Res, Shanghai 201800, Peoples R China
关键词
electrochemical atomic force microscopy; in-situ analysis; surface analysis; electrostatic force; review;
D O I
暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
The principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed. The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM.
引用
收藏
页码:395 / 401
页数:7
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