Microstructure and photoluminescence of Ge-doped mesoporous silica

被引:1
|
作者
Chiang, Ding-Liang [1 ]
Hon, Min-Hsiung [1 ,2 ]
Teoh, Lay Gaik [3 ]
Shieh, Jiann [4 ]
机构
[1] Natl Cheng Kung Univ, Dept Mat Sci & Engn, Tainan 70101, Taiwan
[2] Natl Cheng Kung Univ, Res Ctr Energy Technol & Strategy, Tainan 70101, Taiwan
[3] Natl Pingtung Univ Sci & Technol, Dept Mech Engn, Pingtung, Taiwan
[4] Natl United Univ, Dept Mat Sci & Engn, Miaoli, Taiwan
关键词
Mesoporous; Ge; Photoluminescence; Sol-gel; OXIDE; LIGHT; NANOCRYSTALS; GERMANIUM; MCM-41; FILMS;
D O I
10.1007/s10971-013-3000-2
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nanostructured Ge-doped mesoporous silica powder and thin film were prepared with a cetyltrimethylammonium bromide self-assembled template to investigate the doping effects on the structure and optical properties of mesoporous silica. The X-ray diffraction, transmission electron microscopy and photoluminescence (PL) results suggest that the Ge-doped mesoporous silica with Ge/Si molar ratio of 0.01 was characterized by the strongest PL intensity without phase separation. Worm-like Ge-doped porous silica with specific area up to 987 m(2)/g could be obtained in this study, in which some Si atoms were replaced by Ge atoms according to the X-ray photoelectron spectroscopy analyses. The PL intensity of mesoporous silica could be increased by germanium-induced oxygen-related defects, but for the samples with Ge/Si molar ratios larger than 0.01, the PL intensity decreased due to the phase separation of germanium oxide.
引用
收藏
页码:242 / 247
页数:6
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