Design of free patterns of nanocrystals with ad hoc features via templated dewetting

被引:34
作者
Aouassa, M. [1 ]
Berbezier, I. [1 ]
Favre, L. [1 ]
Ronda, A. [1 ]
Bollani, M. [2 ]
Sordan, R. [2 ]
Delobbe, A. [3 ]
Sudraud, P. [3 ]
机构
[1] Aix Marseille Univ, CNRS, IM2NP, Marseille, France
[2] LNES, Como, Italy
[3] Orsay Phys, Fuveau, France
关键词
amorphous semiconductors; elemental semiconductors; focused ion beam technology; germanium; molecular beam epitaxial growth; nanofabrication; nanopatterning; nanostructured materials; semiconductor epitaxial layers; semiconductor growth; silicon; silicon-on-insulator; wetting; GE NANOCRYSTALS; SILICON NANOCRYSTALS; SI NANOCRYSTALS; CHARGE STORAGE; THIN-FILMS; METAL-ION; IMPLANTATION; EMISSION; ENERGY;
D O I
10.1063/1.4730620
中图分类号
O59 [应用物理学];
学科分类号
摘要
Design of monodisperse ultra-small nanocrystals (NCs) into large scale patterns with ad hoc features is demonstrated. The process makes use of solid state dewetting of a thin film templated through alloy liquid metal ion source focused ion beam (LMIS-FIB) nanopatterning. The solid state dewetting initiated at the edges of the patterns controllably creates the ordering of NCs with ad hoc placement and periodicity. The NC size is tuned by varying the nominal thickness of the film while their position results from the association of film retraction from the edges of the lay out and Rayleigh-like instability. The use of ultra-high resolution LMIS-FIB enables to produce monocrystalline NCs with size, periodicity, and placement tunable as well. It provides routes for the free design of nanostructures for generic applications in nanoelectronics. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4730620]
引用
收藏
页数:4
相关论文
共 52 条
  • [1] Aouassa M., NEW J PHYS IN PRESS
  • [2] Orientation dependence of the elastic instability on strained SiGe films
    Aqua, J. -N.
    Gouye, A.
    Auphan, T.
    Frisch, T.
    Ronda, A.
    Berbezier, I.
    [J]. APPLIED PHYSICS LETTERS, 2011, 98 (16)
  • [3] Origin of preferential sputtering in a-SiO2 during ion beam synthesis of nanocrystals
    Beck, M. J.
    Pantelides, S. T.
    [J]. PHYSICAL REVIEW B, 2009, 79 (03)
  • [4] CLOSE-SPACED ION EMISSION FROM GOLD AND GALLIUM LIQUID-METAL ION-SOURCE
    BENASSAYAG, G
    SUDRAUD, P
    SWANSON, LW
    [J]. SURFACE SCIENCE, 1987, 181 (1-2) : 362 - 369
  • [5] BENASSAYAG G, 1988, SCANNING MICROSCOPY, V2, P1329
  • [6] Growth of ultrahigh-density quantum-confined germanium dots on SiO2 thin films
    Berbezier, I.
    Karmous, A.
    Ronda, A.
    Sgarlata, A.
    Balzarotti, A.
    Castrucci, P.
    Scarselli, M.
    De Crescenzi, M.
    [J]. APPLIED PHYSICS LETTERS, 2006, 89 (06)
  • [7] Formation and ordering of Ge nanocrystals on SiO2 using FIB nanolithography
    Berbezier, I.
    Karmous, A.
    Szkutnik, P. D.
    Ronda, A.
    Sgarlata, A.
    Balzarotti, A.
    Castrucci, P.
    Scarselli, M.
    De Crescenzi, M.
    [J]. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2006, 9 (4-5) : 812 - 816
  • [8] SiGe nanostructures
    Berbezier, I.
    Ronda, A.
    [J]. SURFACE SCIENCE REPORTS, 2009, 64 (02) : 47 - 98
  • [9] Effect of size dependent interface properties on stability of metal clusters on ceramic substrates
    Bonnell, DA
    Liang, Y
    Wagner, M
    Carroll, D
    Ruhle, M
    [J]. ACTA MATERIALIA, 1998, 46 (07) : 2263 - 2270
  • [10] Agglomeration process in thin silicon-, strained silicon-, and silicon germanium-on-insulator substrates
    Capellini, G.
    Ciasca, G.
    De Seta, M.
    Notargiacomo, A.
    Evangelisti, F.
    Nardone, M.
    [J]. JOURNAL OF APPLIED PHYSICS, 2009, 105 (09)