Automated three-axis gonioreflectometer for computer graphics applications

被引:29
作者
Li, Hongsong [1 ]
Foo, Sing-Choong [1 ]
Torrance, Kenneth E. [1 ]
Westin, Stephen H. [1 ]
机构
[1] Cornell Univ, Program Comp Graph, Ithaca, NY 14853 USA
基金
美国国家科学基金会;
关键词
optics; optical devices; scattering; reflectance; reflectometers; computer graphics;
D O I
10.1117/1.2192787
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We describe an automated three-axis gonioreflectometer, which can help increase the physical realism of computer graphics renderings by providing light scattering data for the surfaces in a scene. The gonioreflectometer performs rapid measurements of the bidirectional reflectance distribution function (BRDF) for flat, isotropic, sample surfaces over the complete visible spectrum and over most of the incident and reflection hemispheres. The instrument employs a broadband light source and a detector with a diffraction grating and linear diode array. Validation is achieved by comparisons against reference surfaces and other instruments. The accuracy and spectral and angular ranges of the BRDFs are appropriate for computer graphics imagery, while reciprocity and energy conservation are preserved. Measured BRDFs on rough aluminum, metallic silver paint, and a glossy yellow paint are reported, and an example rendered automotive image is included. (c) 2006 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页数:11
相关论文
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