The role of low-energy electrons in focused electron beam induced deposition: four case studies of representative precursors

被引:148
作者
Thorman, Rachel M. [1 ,2 ,3 ]
Kumar, Ragesh T. P. [1 ,2 ]
Fairbrother, D. Howard [3 ]
Ingolfsson, Oddur [1 ,2 ]
机构
[1] Univ Iceland, Inst Sci, IS-107 Reykjavik, Iceland
[2] Univ Iceland, Dept Chem, Reykjavik, Iceland
[3] Johns Hopkins Univ, Dept Chem, Baltimore, MD 21218 USA
关键词
dipolar dissociation; dissociative electron attachment; dissociative ionization; focused electron beam induced deposition (FEBID); low-energy electron-induced fragmentation; neutral dissociation; COBALT TRICARBONYL NITROSYL; CHEMICAL-VAPOR-DEPOSITION; FIELD-EMITTER ARRAY; TUNGSTEN HEXACARBONYL; INDUCED DECOMPOSITION; SECONDARY ELECTRONS; CROSS-SECTIONS; ATTACHMENT; PLATINUM; MOLECULES;
D O I
10.3762/bjnano.6.194
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Focused electron beam induced deposition (FEBID) is a single-step, direct-write nanofabrication technique capable of writing three-dimensional metal-containing nanoscale structures on surfaces using electron-induced reactions of organometallic precursors. Currently FEBID is, however, limited in resolution due to deposition outside the area of the primary electron beam and in metal purity due to incomplete precursor decomposition. Both limitations are likely in part caused by reactions of precursor molecules with low-energy (<100 eV) secondary electrons generated by interactions of the primary beam with the substrate. These low-energy electrons are abundant both inside and outside the area of the primary electron beam and are associated with reactions causing incomplete ligand dissociation from FEBID precursors. As it is not possible to directly study the effects of secondary electrons in situ in FEBID, other means must be used to elucidate their role. In this context, gas phase studies can obtain well-resolved information on low-energy electron-induced reactions with FEBID precursors by studying isolated molecules interacting with single electrons of well-defined energy. In contrast, ultra-high vacuum surface studies on adsorbed precursor molecules can provide information on surface speciation and identify species desorbing from a substrate during electron irradiation under conditions more representative of FEBID. Comparing gas phase and surface science studies allows for insight into the primary deposition mechanisms for individual precursors; ideally, this information can be used to design future FEBID precursors and optimize deposition conditions. In this review, we give a summary of different low-energy electron-induced fragmentation processes that can be initiated by the secondary electrons generated in FEBID, specifically, dissociative electron attachment, dissociative ionization, neutral dissociation, and dipolar dissociation, emphasizing the different nature and energy dependence of each process. We then explore the value of studying these processes through comparative gas phase and surface studies for four commonly-used FEBID precursors: MeCpPtMe3, Pt(PF3)(4), Co(CO)(3)NO, and W(CO)(6). Through these case studies, it is evident that this combination of studies can provide valuable insight into potential mechanisms governing deposit formation in FEBID. Although further experiments and new approaches are needed, these studies are an important stepping-stone toward better understanding the fundamental physics behind the deposition process and establishing design criteria for optimized FEBID precursors.
引用
收藏
页码:1904 / 1926
页数:23
相关论文
共 87 条
[51]   Dissociative electron attachment to Pt(PF3)4-a precursor for Focused Electron Beam Induced Processing (FEBIP) [J].
May, Olivier ;
Kubala, Dusan ;
Allan, Michael .
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2012, 14 (09) :2979-2982
[52]   Electron impact dissociation of oxygen-containing molecules - A critical review [J].
McConkey, J. W. ;
Malone, C. P. ;
Johnson, P. V. ;
Winstead, C. ;
McKoy, V. ;
Kanik, I. .
PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 2008, 466 (1-3) :1-103
[53]   A new sequential EBID process for the creation of pure Pt structures from MeCpPtMe3 [J].
Mehendale, S. ;
Mulders, J. J. L. ;
Trompenaars, P. H. F. .
NANOTECHNOLOGY, 2013, 24 (14)
[54]   Electron beam induced deposition at elevated temperatures: compositional changes and purity improvement [J].
Mulders, J. J. L. ;
Belova, L. M. ;
Riazanova, A. .
NANOTECHNOLOGY, 2011, 22 (05)
[55]   Electrical properties of platinum interconnects deposited by electron beam induced deposition of the carbon-free precursor, Pt(PF3)4 [J].
O'Regan, Colm ;
Lee, Angelica ;
Holmes, Justin D. ;
Petkov, Nikolay ;
Trompenaars, Piet ;
Mulders, Hans .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2013, 31 (02)
[56]   Monte Carlo simulation of yield and energy distribution of secondary electrons emitted from metal surfaces [J].
Ohya, K ;
Harada, A ;
Kawata, J ;
Nishimura, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (12A) :6226-6232
[57]   Dissociative electron attachment to the complexation ligands hexafluoroacetylacetone, trifluoroacetylacetone and acetylacetone; a comparative experimental and theoretical study [J].
Omarsson, Benedikt ;
Engmann, Sarah ;
Ingolfsson, Oddur .
RSC ADVANCES, 2014, 4 (63) :33222-33235
[58]   Chemical control through dissociative electron attachment - A study on pentafluorotoluene, pentafluoroaniline and pentafluorophenol [J].
Omarsson, Benedikt ;
Bjarnason, Elias H. ;
Ingolfsson, Oddur ;
Haughey, Sean ;
Field, Thomas A. .
CHEMICAL PHYSICS LETTERS, 2012, 539 :7-10
[59]   Dissociative electron attachment to gas phase valine:: A combined experimental and theoretical study [J].
Papp, Peter ;
Urban, Jan ;
Matejcik, Stefan ;
Stano, Michal ;
Ingolfsson, Oddur .
JOURNAL OF CHEMICAL PHYSICS, 2006, 125 (20)
[60]   An experimental and theoretical study on structural parameters and energetics in ionization and dissociation of cobalt tricarbonyl nitrosyl [J].
Papp, Peter ;
Engmann, Sarah ;
Kucera, Marek ;
Stano, Michal ;
Matejcik, Stefan ;
Ingolfsson, Oddur .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY, 2013, 356 :24-32