Contactless Qualitative Series Resistance Imaging on Solar Cells

被引：30

作者：

Kasemann, Martin ^{[1
]}

Reindl, Leonhard M. ^{[1
]}

Michl, Bernhard ^{[2
]}

Warta, Wilhelm ^{[2
]}

Schuett, Andreas ^{[3
]}

Carstensen, Juergen ^{[3
]}

机构：

[1] Univ Freiburg, Dept Microsyst Engn, D-79110 Freiburg, Germany

[2] Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany

[3] Univ Kiel, Inst Mat Sci, D-24143 Kiel, Germany

来源：

IEEE JOURNAL OF PHOTOVOLTAICS | 2012年 / 2卷 / 02期

关键词：

Failure analysis; semiconductor device testing; SILICON; DARK;

D O I：

10.1109/JPHOTOV.2012.2184524

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

We present a qualitative method for series resistance imaging that generates lateral current flow in solar cells without electrical contacting. The applicability of the method is demonstrated on a multicrystalline silicon solar cell, and the results are briefly discussed with respect to lifetime artifacts and injection dependence of the series resistance distribution. The method overcomes one of the major drawbacks of state-of-the-art series resistance imaging methods, which require electrical contacting for current injection or extraction. It allows for all-contactless measurements, reduces the cell breakage rate, and simplifies the measurement setup and sample handling.

引用

页码：181 / 183

页数：3

共 21 条

[1] The effect of diffusion-limited lifetime on implied current voltage curves based on photoluminescence data [J].

Abbott, M. D. ;

Bardos, R. A. ;

Trupke, T. ;

Fisher, K. C. ;

Pink, E. .

JOURNAL OF APPLIED PHYSICS, 2007, 102 (04)

[2]

ABERLE AG, 1993, IEEE PHOT SPEC CONF, P133, DOI 10.1109/PVSC.1993.347065

[3] THE EFFECT OF DISTRIBUTED SERIES RESISTANCE ON THE DARK AND ILLUMINATED CURRENT VOLTAGE CHARACTERISTICS OF SOLAR-CELLS [J].

ARAUJO, GL ;

CUEVAS, A ;

RUIZ, JM .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1986, 33 (03) :391-401

[4] Quantitative evaluation of electroluminescence images of solar cells [J].

Breitenstein, O. ;

Khanna, A. ;

Augarten, Y. ;

Bauer, J. ;

Wagner, J. -M. ;

Iwig, K. .

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4 (1-2) :7-9

[5]

CARSTENSEN J, 2007, 22 EUR PHOT SOL EN C

[6] Separation of local bulk and surface recombination in crystalline silicon from luminescence reabsorption [J].

Giesecke, J. A. ;

Kasemann, M. ;

Schubert, M. C. ;

Wuefel, P. ;

Warta, W. .

PROGRESS IN PHOTOVOLTAICS, 2010, 18 (01) :10-19

[7] Determination of local minority carrier diffusion lengths in crystalline silicon from luminescence images [J].

Giesecke, J. A. ;

Kasemann, M. ;

Warta, W. .

JOURNAL OF APPLIED PHYSICS, 2009, 106 (01)

[8] Spatially resolved determination of dark saturation current and series resistance of silicon solar cells [J].

Glatthaar, Markus ;

Haunschild, Jonas ;

Kasemann, Martin ;

Giesecke, Johannes ;

Warta, Wilhelm ;

Rein, Stefan .

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2010, 4 (1-2) :13-15

[9] Fast series resistance imaging for silicon solar cells using electroluminescence [J].

Haunschild, Jonas ;

Glatthaar, Markus ;

Kasemann, Martin ;

Rein, Stefan ;

Weber, Eicke R. .

PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS, 2009, 3 (7-8) :227-229

[10] Series resistance imaging of solar cells by voltage dependent electroluminescence [J].

Hinken, David ;

Ramspeck, Klaus ;

Bothe, Karsten ;

Fischer, Bernhard ;

Brendel, Rolf .

APPLIED PHYSICS LETTERS, 2007, 91 (18)

← 1 2 3 →