Review of shock wave detection method in CFD post-processing

被引:62
作者
Wu Ziniu [1 ]
Xu Yizhe [1 ]
Wang Wenbin [1 ]
Hu Ruifeng [1 ]
机构
[1] Tsinghua Univ, Sch Aerosp, Beijing 100084, Peoples R China
关键词
Aerodynamics; Automatic detection; Computational fluid dynamics; Shock wave; Post-processing; VISUALIZATION;
D O I
10.1016/j.cja.2013.05.001
中图分类号
V [航空、航天];
学科分类号
08 ; 0825 ;
摘要
In the present computational fluid dynamics (CFD) community, post-processing is regarded as a procedure to view parameter distribution, detect characteristic structure and reveal physical mechanism of fluid flow based on computational or experimental results. Field plots by contours, iso-surfaces, streamlines, vectors and others are traditional post-processing techniques. While the shock wave, as one important and critical flow structure in many aerodynamic problems, can hardly be detected or distinguished in a direct way using these traditional methods, due to possible confusions with other similar discontinuous flow structures like slip line, contact discontinuity, etc. Therefore, method for automatic detection of shock wave in post-processing is of great importance for both academic research and engineering applications. In this paper, the current status of methodologies developed for shock wave detection and implementations in post-processing platform are reviewed, as well as discussions on advantages and limitations of the existing methods and proposals for further studies of shock wave detection method. We also develop an advanced post-processing software, with improved shock detection. (C) 2013 Production and hosting by Elsevier Ltd. on behalf of CSAA & BUAA.
引用
收藏
页码:501 / 513
页数:13
相关论文
共 38 条
[1]  
Anderson J. D., 1989, Hypersonic and High Temperature Gas Dynamics
[2]  
Anderson JD, 2016, Fundamentals of Aerodynamics, V6th
[3]  
Andreadis D., 2004, Ind. Phys, V10, P24
[4]  
[Anonymous], P C VIS 00 2000 OCT
[5]  
[Anonymous], AIAA20113681
[6]  
[Anonymous], SEARCHING HORIZON HI
[7]  
[Anonymous], 6 EUR S AER SPAC VEH
[8]  
[Anonymous], P 11 M APPL SCI COMP
[9]  
[Anonymous], AFRLSRBLTR980724 MIT
[10]  
[Anonymous], AIAA95117