2017 12TH INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE (IMPACT)
|
2017年
关键词:
WLAN Rx Sensitivity;
Non-Contact Measurement;
RF System Simulation;
SystemVue;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
In the past, Rx sensitivity analysis was limited to lack of accurate noise source spectrum and methodology to judge whether the noise level degrades the Rx sensitivity or not. Since spectrum of noise source is difficult to be accurately measured, which is indispensable for complete WLAN Rx sensitivity analysis, non-contact probing method is therefore developed. With the capability of noise source spectrum measured and system simulation by software "SystemVue", the overall WLAN Rx sensitivity analysis can be realized through simulation and leads to about 3dB deviation from measurement result. This paper develops a systematical analysis procedure from noise spectrum measurement to WLAN RF system simulation with only 3dB deviation if compare to measurement result.