A twelve-analyzer detector system for high-resolution powder diffraction

被引：299

作者：

Lee, Peter L. ^{[1
]}

Shu, Deming ^{[1
]}

Ramanathan, Mohan ^{[1
]}

Preissner, Curt ^{[1
]}

Wang, Jun ^{[1
]}

Beno, Mark A. ^{[1
]}

Von Dreele, Robert B. ^{[1
]}

Ribaud, Lynn ^{[1
]}

Kurtz, Charles ^{[1
]}

Antao, Sytle M. ^{[1
]}

Jiao, Xuesong ^{[1
]}

Toby, Brian H. ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2008年 / 15卷 / 427-432期

关键词：

multi-analyzer; instrumentation; powder diffraction;

D O I：

10.1107/S0909049508018438

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A dedicated high-resolution high-throughput X-ray powder diffraction beamline has been constructed at the Advanced Photon Source (APS). In order to achieve the goals of both high resolution and high throughput in a powder instrument, a multi-analyzer detector system is required. The design and performance of the 12-analyzer detector system installed on the powder diffractometer at the 11-BM beamline of APS are presented.

引用

页码：427 / 432

页数：6

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