Influence of molecular beam effusion cell quality on optical and electrical properties of quantum dots and quantum wells

被引:2
|
作者
Nguyen, G. N. [1 ,4 ]
Korsch, A. R. [1 ]
Schmidt, M. [1 ]
Ebler, C. [1 ]
Labud, P. A. [1 ]
Schott, R. [1 ]
Lochner, P. [1 ,2 ,3 ]
Brinks, F. [1 ,2 ,3 ]
Wieck, A. D. [1 ]
Ludwig, A. [1 ]
机构
[1] Ruhr Univ Bochum, Lehrstuhl Angew Festkorperphys, Univ Str 150, D-44780 Bochum, Germany
[2] Univ Duisburg Essen, Fak Phys, Lotharstr 1, D-46048 Duisburg, Germany
[3] Univ Duisburg Essen, CENIDE, Lotharstr 1, D-46048 Duisburg, Germany
[4] Univ Basel, Dept Phys, Basel, Switzerland
关键词
Defects; Quantum dot; Quantum well; Molecular beam epitaxy; Semiconducting III-V materials; Semiconducting aluminum compounds; SPIN NOISE; CHARGE; SPECTROSCOPY;
D O I
10.1016/j.jcrysgro.2020.125884
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Quantum dot heterostructures with excellent low-noise properties became possible with high purity materials recently. We present a study on molecular beam epitaxy grown quantum wells and quantum dots with a contaminated aluminum evaporation cell, which introduced a high amount of impurities, perceivable in anomalies in optical and electrical measurements. We describe a way of addressing this problem and find that reconditioning the aluminum cell by overheating can lead to a full recovery of the anomalies in photo-luminescence and capacitance-voltage measurements, leading to excellent low noise heterostructures. Furthermore, we propose a method to sense photo-induced trap charges using capacitance-voltage spectroscopy on self-assembled quantum dots. Excitation energy-dependent ionization of defect centers leads to shifts in capacitance-voltage spectra which can be used to determine the charge density of photo-induced trap charges via 1D band structure simulations. This method can be performed on frequently used quantum dot diode structures.
引用
收藏
页数:8
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