Recent Advances and Future Prospects in Functional-Oxide Nanoelectronics: The Emerging Materials and Novel Functionalities that are Accelerating Semiconductor Device Research and Development

被引:35
作者
Akinaga, Hiroyuki [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Innovat Ctr Adv Nanodevices, Tsukuba, Ibaraki 3058569, Japan
基金
日本科学技术振兴机构;
关键词
INSULATOR-TRANSITION; HIGH-SPEED; LOW-POWER; RESISTANCE; MEMORY; RERAM; NANOFILAMENTS;
D O I
10.7567/JJAP.52.100001
中图分类号
O59 [应用物理学];
学科分类号
摘要
Nanoelectronics is a fundamental technology that supports industry and society. Recently, new nanomaterials and nanostructures have been incorporated into device fabrication processes, leading to significant developments in nanoelectronics. In this review, the current status and future prospects of the research and development of functional oxide devices, in which a phase transition in strongly correlated electron systems and a current-induced redox reaction are utilized, are discussed as typical examples of recent developments. In addition, a scheme for research and development is proposed to accelerate the development of ecosystem in the field of nanoelectronics by systematizing the technologies related to new materials and structures. (C) 2013 The Japan Society of Applied Physics
引用
收藏
页数:12
相关论文
共 72 条
[1]   Electric field effect in correlated oxide systems [J].
Ahn, CH ;
Triscone, JM ;
Mannhart, J .
NATURE, 2003, 424 (6952) :1015-1018
[2]   ReRAM technology; challenges and prospects [J].
Akinaga, Hiro ;
Shima, Hisashi .
IEICE ELECTRONICS EXPRESS, 2012, 9 (08) :795-807
[3]   Resistive Random Access Memory (ReRAM) Based on Metal Oxides [J].
Akinaga, Hiroyuki ;
Shima, Hisashi .
PROCEEDINGS OF THE IEEE, 2010, 98 (12) :2237-2251
[4]  
[Anonymous], 2011, IEDM11
[5]  
[Anonymous], 2011, IEEE IEDM P
[6]   Tuning of the metal-insulator transition in electrolyte-gated NdNiO3 thin films [J].
Asanuma, S. ;
Xiang, P. -H. ;
Yamada, H. ;
Sato, H. ;
Inoue, I. H. ;
Akoh, H. ;
Sawa, A. ;
Ueno, K. ;
Shimotani, H. ;
Yuan, H. ;
Kawasaki, M. ;
Iwasa, Y. .
APPLIED PHYSICS LETTERS, 2010, 97 (14)
[7]   Highly scalable non-volatile resistive memory using simple binary oxide driven by asymmetric unipolar voltage pulses [J].
Baek, IG ;
Lee, MS ;
Seo, S ;
Lee, MJ ;
Seo, DH ;
Suh, DS ;
Park, JC ;
Park, SO ;
Kim, HS ;
Yoo, IK ;
Chung, UI ;
Moon, JT .
IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2004, TECHNICAL DIGEST, 2004, :587-590
[8]   Reproducible switching effect in thin oxide films for memory applications [J].
Beck, A ;
Bednorz, JG ;
Gerber, C ;
Rossel, C ;
Widmer, D .
APPLIED PHYSICS LETTERS, 2000, 77 (01) :139-141
[9]   Superconductor-insulator transition in La2-xSrxCuO4 at the pair quantum resistance [J].
Bollinger, A. T. ;
Dubuis, G. ;
Yoon, J. ;
Pavuna, D. ;
Misewich, J. ;
Bozovic, I. .
NATURE, 2011, 472 (7344) :458-460
[10]   Random circuit breaker network model for unipolar resistance switching [J].
Chae, Seung Chul ;
Lee, Jae Sung ;
Kim, Sejin ;
Lee, Shin Buhm ;
Chang, Seo Hyoung ;
Liu, Chunli ;
Kahng, Byungnam ;
Shin, Hyunjung ;
Kim, Dong-Wook ;
Jung, Chang Uk ;
Seo, Sunae ;
Lee, Myoung-Jae ;
Noh, Tae Won .
ADVANCED MATERIALS, 2008, 20 (06) :1154-+