Imaging and alignment of nanoscale 180° stripe domains in ferroelectric thin films

被引：55

作者：

Thompson, Carol ^{[1
]}

Fong, D. D. ^{[2
]}

Wang, R. V. ^{[2
,3
]}

Jiang, F. ^{[2
]}

Streiffer, S. K. ^{[3
]}

Latifi, K. ^{[1
]}

Eastman, J. A. ^{[2
]}

Fuoss, P. H. ^{[2
]}

Stephenson, G. B. ^{[2
,3
]}

机构：

[1] No Illinois Univ, Dept Phys, De Kalb, IL 60115 USA

[2] Argonne Natl Lab, Div Mat Sci, Argonne, IL 60439 USA

[3] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

来源：

APPLIED PHYSICS LETTERS | 2008年 / 93卷 / 18期

关键词：

atomic force microscopy; electric domains; ferroelectric thin films; lead compounds; X-ray scattering;

D O I：

10.1063/1.3013512

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Nanometer-period ferroelectric 180 degrees stripe domains are observed in epitaxial PbTiO(3) films using atomic force microscopy. Stripe domains can be aligned with surface step edges or in preferred crystallographic directions. A stripe alignment map as a function of temperature and film thickness is determined using synchrotron x-ray scattering. Pinning by step edges permits control of stripe domain morphology, as demonstrated by a film grown on a vicinal surface.

引用

页数：3

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