Capturing the signature of single atoms with the tiny probe of a STEM

被引:30
作者
Colliex, C. [1 ]
Gloter, A. [1 ]
March, K. [1 ]
Mory, C. [1 ]
Stephan, O. [1 ]
Suenaga, K. [2 ]
Tence, M. [1 ]
机构
[1] Univ Paris 11, Phys Solides Lab, UMR CNRS 8502, F-91405 Orsay, France
[2] Natl Inst Adv Ind Sci & Technol, Nanotube Res Ctr, Tsukuba, Ibaraki 3058565, Japan
关键词
Scanning transmission electron microscope (STEM); Electron energy loss spectrometry (EELS); Single atom identification; TRANSMISSION ELECTRON-MICROSCOPY; ENERGY-LOSS SPECTROSCOPY; SPATIAL-RESOLUTION; DETECTION LEVEL; ABERRATION; FIELD; KV; MICROANALYSIS; SPECTROMETER; VOLTAGE;
D O I
10.1016/j.ultramic.2012.04.003
中图分类号
TH742 [显微镜];
学科分类号
摘要
With their first scanning transmission electron microscope (STEM), Albert Crewe and his collaborators have succeeded 40 years ago in bringing to reality a dream for all electron microscopists, to see individual atoms. In the derivation of Crewe's pioneering work, the present review describes various historical and present steps, involving continuous instrumental and methodological developments as well as the preparation of suitable specimens. They have lead to the identification of individual atoms by electron energy-loss spectroscopy (EELS) and to the demonstration of atom-by-atom spectroscopy. Beyond these spectacular successes which open wide fields of use, most recent technical achievements, such as the introduction of monochromators on the incident electron beam or of optical spectrometers for recording spectra (in the visible as well as in the X-ray domain), will undoubtedly lead to refine the accessible signature of single atoms and molecules. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:80 / 89
页数:10
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