Injection of a magnetic domain wall into a submicron magnetic wire

被引:90
作者
Shigeto, K [1 ]
Shinjo, T
Ono, T
机构
[1] Kyoto Univ, Inst Chem Res, Uji 6110011, Japan
[2] Keio Univ, Fac Sci & Technol, Yokohama, Kanagawa 2238522, Japan
关键词
D O I
10.1063/1.125159
中图分类号
O59 [应用物理学];
学科分类号
摘要
Two types of magnetic wires (150 nm width) with trilayer structure consisting of NiFe (20 nm)/Cu (20 nm)/Co (20 nm) were prepared. One was connected to a square pad (0.5x0.5 mu m(2)) at one end, while the other has a symmetrical shape with two flat ends. Magnetization reversal was detected sensitively by magnetoresistance measurement. Switching field of the Co layer for the wire with a pad was much smaller than that for the wire without a pad. This indicates that a domain wall nucleates initially in the pad and is injected into the wire at the switching field. This model for the magnetization reversal process is supported by the angular dependence of the switching field. (C) 1999 American Institute of Physics. [S0003-6951(99)00944-4].
引用
收藏
页码:2815 / 2817
页数:3
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