Pressure dependence of the energy gaps in diamond-type semiconductors, and their III-V analogues such as InSb

被引:9
作者
Angilella, G. G. N. [1 ,2 ,3 ]
March, N. H. [4 ,5 ]
Howard, I. A. [6 ]
Pucci, R. [1 ,2 ,3 ]
机构
[1] Univ Catania, Dipartimento Fis & Astron, Via S Sofia 64, I-95123 Catania, Italy
[2] Ist Nazl Fis Nucl, Sez Catania, I-95123 Catania, Turkey
[3] CNISM, UdR Catania, I-95123 Catania, Italy
[4] Univ Oxford, Oxford, England
[5] Univ Antwerp, Dept Phys, B-2020 Antwerp, Belgium
[6] Free Univ Brussels VUB, Dept Chem ALGC, B-1050 Brussels, Belgium
来源
JOINT 21ST AIRAPT AND 45TH EHPRG INTERNATIONAL CONFERENCE ON HIGH PRESSURE SCIENCE AND TECHNOLOGY | 2008年 / 121卷
关键词
tetrahedral semiconductors; pressure dependence; lattice parameter dependence; energy gap; III-V compounds; X-ray spectroscopy;
D O I
10.1088/1742-6596/121/3/032006
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
In earlier work by March and Matthai [Phil. Mag. Lett. 84, 335 (2004)], the energy gaps E-g of the diamond-type semiconductors C, Si, Ge and alpha-Sn were shown to correlate well with the mean interelectronic separation r(s) of the 4 valence electrons per atom. Furthermore for the III-V analogues such as GaAs and InSb, it was demonstrated that a useful extension could be effected by introducing additionally the electronegativity difference between the constituent atoms. Here, we consider available experimental data, and their interpretation, for such energy gaps, as a function of pressure. The intensity of the X-ray forbidden reflections will also be discussed under pressure.
引用
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页数:5
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