Electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy and resonant inelastic x-ray scattering

Here, we report a study of the electronic structure of La5/3Sr1/3NiO4 by x-ray emission spectroscopy (XES) and resonant inelastic x-ray scattering (RIXS). The combination of these techniques has permitted us to reveal a complete picture of the occupied and unoccupied states, and to identify various charge transfer transitions appearing as inelastic features in the RIXS spectra. The results add further information on the electronic excitations in this system, and show how the combination of XES and RIXS can be an important experimental tool to address basic physics of complex systems. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4726248]