Synchrotron radiation induced X-ray microfluorescence analysis

被引:0
作者
Janssens, K
Vincze, L
Vekemans, B
Aerts, A
Adams, F
Jones, KW
Knochel, A
机构
[1] BROOKHAVEN NATL LAB,DEPT APPL SCI,UPTON,NY 11973
[2] UNIV HAMBURG,DEPT CHEM,D-20146 HAMBURG,GERMANY
关键词
synchrotron radiation; microscopic X-ray fluorescence analysis; X-ray fluorescence analysis; trace elements; procelain analysis; fluid inclusions; archeological glass;
D O I
暂无
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
mu-XRF is the microscopic equivalent of the well-established multielement analytical technique. In this paper, after comparing the interaction of X-ray photons, electrons and protons with matter and an introduction to synchrotron rings and microfocussing of X-rays, the instrumentation for mu-XRF is discussed, both for laboratory source and synchrotron based setups and the analytical characteristics of mu-XRF are contrasted to that of other microanalytical techniques, Also, this issue of quantification of mu-XRF data is addressed; the applicability of the method in archeological and geological analysis is illustrated.
引用
收藏
页码:87 / 115
页数:29
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