Measurement of paper surface topography by white light interferometric microscope

被引：0
|
作者：
Okauchi, S [1 ]
机构：
[1] Oji Paper Co Ltd, Mat Anal Ctr R&D Div, Amagasaki, Hyogo 6608577, Japan
来源：
JOURNAL OF JAPANESE SOCIETY OF TRIBOLOGISTS | 2001年 / 46卷 / 10期
关键词：
while light interferometric microscope; surface roughness of papers;
D O I：
暂无
中图分类号：
TH [机械、仪表工业];
学科分类号：
0802 ;
摘要：
引用
收藏
页码：759 / 764
页数：6
相关论文
共 50 条
  • [1] Measurement of paper surface structure by white light interferometric microscope
    Okauchi, S.
    Toraibarojisuto/Journal of Japanese Society of Tribologists, 2001, 46 (10): : 759 - 764
  • [2] Advances in Scanning White Light Interferometry for Surface Topography Measurement
    Su Rong
    Liu Jiayu
    Qiao Xiaoyue
    Jian Zhenxiong
    Zhang Zheng
    Wen Rongxian
    Chen Cheng
    Ren Mingjun
    Zhu Limin
    LASER & OPTOELECTRONICS PROGRESS, 2023, 60 (03)
  • [3] White light interferometric surface profiler
    Bowe, B
    Toal, V
    OPTICAL ENGINEERING, 1998, 37 (06) : 1796 - 1799
  • [4] Optical interferometry microscope for surface topography measurement
    Nishikawa T.
    Seimitsu Kogaku Kaishi/Journal of the Japan Society for Precision Engineering, 2010, 76 (09): : 999 - 1002
  • [5] Measurement of PMMA ablation profiles with a white light interferometric surface profiler.
    Reinholz, FN
    Adie, SG
    Reid, PG
    van Saarloos, PP
    Suplewski, G
    Eikelboom, RH
    INVESTIGATIVE OPHTHALMOLOGY & VISUAL SCIENCE, 2000, 41 (04) : S689 - S689
  • [6] White-Light Interferometric Sensor for Rough Surface Height Distribution Measurement
    Manojlovic, Lazo Mihajlo
    Zivanov, Milos B.
    Marincic, Aleksandar S.
    IEEE SENSORS JOURNAL, 2010, 10 (06) : 1125 - 1132
  • [7] Calibration method of the phase-shifting error for the topography measurement utilizing white light interferometric microscopy
    Zhang C.
    Yuan Q.
    Zhang J.
    Ji Y.
    Gao Z.
    Yan J.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2022, 51 (07):
  • [8] Surface topography measurement based on color images processing in white light interferometry
    Guo, Tong
    Gu, Yue
    Chen, Jinping
    Fu, Xing
    Hu, Xiaotang
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX, 2015, 9525
  • [9] Interferometric surface profiling with white light: Effects of surface films
    Hariharan, P
    Roy, M
    JOURNAL OF MODERN OPTICS, 1996, 43 (09) : 1797 - 1800
  • [10] Measurement of surface roughness of aluminum ground samples using white light interference microscope
    Sidki, H.M.
    Journal of Optics (India), 2001, 30 (04): : 143 - 150
12345