The potential of luminescence signals from electronic components for accident dosimetry

被引:40
作者
Pascu, A. [1 ]
Vasiliniuc, S. [1 ]
Zeciu-Dolha, M. [1 ]
Timar-Gabor, A. [1 ]
机构
[1] Univ Babes Bolyai, Fac Environm Sci & Engn, Cluj Napoca 400294, Romania
关键词
OSL; Electronic components; Chip card modules; Accident dosimetry; REGENERATIVE-DOSE PROTOCOL; RETROSPECTIVE DOSIMETRY; QUARTZ; CARD;
D O I
10.1016/j.radmeas.2013.03.013
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
This study investigated the optically stimulated luminescence of a large number of electronic components extracted from both old and new generation mobile phones and chip modules of phone cards. Most resistors and all chip modules studied present a linear dose response (R> 0.99) in the dose range investigated (200 mGy up to 6 Gy, respectively 10 Gy), while capacitors, inductors and integrated circuits generally have a non-linear growth (exponential or cubic). For our experimental setup, an average specific luminescence of similar to 20,000 cts in 2 s/Gy (n = 10) and similar to 6000 cts in 2 s/Gy (n = 14) was obtained for two types of chip modules with a relatively high degree of homogeneity (relative standard deviation of 23% and 31%) and a minimum detectable dose of 7 mGy for immediate measurement. The investigated signals show small sensitivity changes (generally <10%) after repeated cycles of irradiation and readout. Preliminary fading measurements are presented. It can be concluded that most mobile phones and phone card components have a significant potential as retrospective luminescence dosimeters. 2013 Elsevier Ltd. All rights reserved.
引用
收藏
页码:384 / 388
页数:5
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