Transmission electron diffraction determination of the Ge(001)-(2x1) surface structure

被引：6
作者：
CollazoDavila, C
Grozea, D
Landree, E
Marks, LD
机构：
[1] Dept. of Mat. Sci. and Engineering, Northwestern University, Evanston
来源：
SURFACE SCIENCE | 1997年 / 375卷 / 2-3期
基金：
美国国家科学基金会;
关键词：
computer simulations; electron energy loss spectroscopy; Ge(001)-(2x1); germanium; low index single crystal surfaces; surface relaxation and reconstruction; transmission high-energy electron diffraction; X-RAY-DIFFRACTION; TUNNELING MICROSCOPY; SI(100) SURFACE; GE(100) SURFACE; RECONSTRUCTION; TRANSITION; COMPLEXES; PATTERNS; SI(001); DIMERS;
D O I：
10.1016/S0039-6028(96)01272-1
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
The lateral displacements in the Ge(001)-(2x1)surface reconstruction have been determined using transmission electron diffraction (TED). The best-fit model includes displacements extending six layers into the bulk. The atomic positions found agree with X-ray studies to within a few hundredths of an angstrum. With the positions determined so precisely, it is suggested that the Ge(001)(2x1) surface can now serve as a standard for comparison with theoretical surface structure calculations. The results from the currently available theoretical studies on the surface are compared with the experimentally determined structure. (C) 1997 Elsevier Science B.V.
引用
收藏
页码：293 / 301
页数：9
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