Rainflow Algorithm-Based Lifetime Estimation of Power Semiconductors in Utility Applications

被引：86
作者：
GopiReddy, Lakshmi Reddy [1 ]
Tolbert, Leon M. [1 ,2 ]
Ozpineci, Burak [1 ,2 ]
Pinto, Joao O. P. [3 ]
机构：
[1] Univ Tennessee, Dept Elect Engn & Comp Sci, Knoxville, TN 37996 USA
[2] Oak Ridge Natl Lab, Power Elect & Elect Machinery Res Grp PEEMRG, Knoxville, TN 37932 USA
[3] Univ Fed Mato Grosso do Sul, Dept Elect Engn, BR-79070900 Campo Grande, Brazil
来源：
IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 2015年 / 51卷 / 04期
基金：
美国国家科学基金会;
关键词：
Cycle counting; lifetime estimation; power semiconductor reliability; rainflow algorithms; STATCOM; DEVICE RELIABILITY; PREDICTION; TEMPERATURE; MODULES; STATCOM; IGBT;
D O I：
10.1109/TIA.2015.2407055
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Rainflow algorithms are one of the popular counting methods used in fatigue and failure analysis in conjunction with semiconductor lifetime estimation models. However, the rain-flow algorithm used in power semiconductor reliability does not consider the time-dependent mean temperature calculation. The equivalent temperature calculation proposed by Nagode et al. is applied to semiconductor lifetime estimation in this paper. A month-long arc furnace load profile is used as a test profile to estimate temperatures in insulated-gate bipolar transistors (IGBTs) in a STATCOM for reactive compensation of load. The degradation in the life of the IGBT power device is predicted based on time-dependent temperature calculation.
引用
收藏
页码：3368 / 3375
页数：8
相关论文
共 32 条
  • [1] Reliability Considerations for Parallel Performance of Semiconductor Switches in High-Power Switching Power Supplies
    Abdi, Babak
    Ranjbar, Amir Hossein
    Gharehpetian, Gevorg B.
    Milimonfared, Jafar
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2009, 56 (06) : 2133 - 2139
  • [2] STANDARDIZATION OF THE RAINFLOW COUNTING METHOD FOR FATIGUE ANALYSIS
    AMZALLAG, C
    GEREY, JP
    ROBERT, JL
    BAHUAUD, J
    [J]. INTERNATIONAL JOURNAL OF FATIGUE, 1994, 16 (04) : 287 - 293
  • [3] [Anonymous], 2010, REL CONS INT SMART G
  • [4] [Anonymous], INT J COMPUT SCI MAN
  • [5] [Anonymous], 2011, P 14 EUR C POW EL AP
  • [6] [Anonymous], 2003, RAINFLOW COUNTING AL
  • [7] Reliability comparison of matrix and other converter topologies
    Aten, M.
    Towers, G.
    Whitley, C.
    Wheeler, P.
    Clare, J.
    Bradley, K.
    [J]. IEEE TRANSACTIONS ON AEROSPACE AND ELECTRONIC SYSTEMS, 2006, 42 (03) : 867 - 875
  • [8] Bannantine J.A., 1990, Fundamentals of Metal Fatigue Analysis
  • [9] Bayerer R., 2008, PROC 5 INT C INTEGR, P37
  • [10] Advanced IGBT modules for railway traction applications: Reliability testing
    Berg, H
    Wolfgang, E
    [J]. MICROELECTRONICS RELIABILITY, 1998, 38 (6-8) : 1319 - 1323
1234