Accurate Analytical Model for Single Event (SE) Crosstalk

被引:7
|
作者
Liu, Baojun [1 ]
Cai, Li [1 ]
Zhu, Jing [2 ]
机构
[1] AF Engn Univ, Dept Elect Sci & Technol, Inst Sci, Xian 710051, Shannxi, Peoples R China
[2] NW A&F Univ, Dept Food Sci, Coll Food Sci & Engn, Yangling 712100, Shannxi, Peoples R China
基金
中国国家自然科学基金;
关键词
Analytical model; equivalent circuit; point admittance; single event crosstalk; CMOS CIRCUITS; INTERCONNECTS; TRANSIENTS;
D O I
10.1109/TNS.2012.2204901
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
With advances in modern technology, circuits become more sensitive to single event transient (SET) due to decreased device feature size and increased coupling effects among interconnects, which might cause SET to affect multiple logic paths. This paper proposed an accurate and efficient SE crosstalk estimation model based on point admittance and equivalent circuit of SET. The proposed model uses a 6-node template circuit of interconnect and simplifies the calculation by use of point admittance. By use of Taylor series expansion theorem, the analytical expressions of noise peak voltage and pulse width are obtained. The waveform of SE crosstalk in the analytical model is very good in agreement with SPICE. Results from 1000 random cases show that by comparison with previous works, the model has a significant improved accuracy with an average error of only 3.07% in noise peak voltage, and 8.11% in pulse width, respectively. These results validate that the analytical model is efficient and accurate.
引用
收藏
页码:1621 / 1627
页数:7
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