Microstructure and x-ray microtomographic characterisation of deformation in electrodeposited nickel thin-walled hollow spheres

被引：9

作者：

Li, P. ^{[1
]}

Petrinic, N. ^{[2
]}

Siviour, C. R. ^{[2
]}

机构：

[1] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore

[2] Univ Oxford, Dept Engn Sci, Solid Mech & Mat Engn Grp, Oxford OX1 3PJ, England

来源：

MATERIALS LETTERS | 2013年 / 100卷

关键词：

Nanocrystalline; Electrodeposited nickel; Hollow spheres; Deformation; X-ray microtomography; MECHANICAL-BEHAVIOR; STRAIN-RATE; NI; STACKING; FOAM;

D O I：

10.1016/j.matlet.2013.03.022

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Nanocrystalline grain sizes in the walls of electrodeposited nickel thin-walled hollow spheres were quantified in FIB-TEM and found to fit a log-normal distribution. Based on the microstructure and nanoindentation properties, reliable material data were determined and related to predict bulk compressive behaviour of the spheres through a finite element model. X-ray microtomography of specimens under compression validates the model, and reveals the 3D deformation/failure mechanisms that dominate macroscopic response of the sphere: multiple buckling and contacts in wall materials. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：233 / 236

页数：4

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