Rate equation of current degradation of the spindt-type field emitter array

被引：0

作者：

Xie, CG ^{[1
]}

Dworsky, L ^{[1
]}

机构：

[1] Motorola Inc, Motorola Labs, Tempe, AZ 85284 USA

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 2004年 / 51卷 / 04期

关键词：

contamination; current degradation; electron emission; field emission display;

D O I：

10.1109/TED.2004.823796

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The degradation rate of the emission current of the Spindt-type field emitter arrays in the display environment has been measured. The relative degradation rate is found to be a function of the square of emission current and proportional to the anode bias (voltage). A life model is presented that leads to development of an analytical rate equation of emission current degradation. Based on this model, there is a steady-state level at which the emission current is stable. The steady-state emission current depends on anode bias, background pressure in the package and cleanliness of anode and cathode surfaces. Experimental results are consistent with the rate equation derived from the model. Since the model does not include any material and process that make the cathode, it could probably apply to any field emission cathodes.

引用

页码：644 / 647

页数：4