Recent advances in diamond power semiconductor devices

被引:161
|
作者
Umezawa, Hitoshi [1 ,2 ,3 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Adv Power Elect Res Ctr, Osaka 5638577, Japan
[2] Univ Grenoble Alpes, Inst NEEL, F-38000 Grenoble, France
[3] CNRS, Inst NEEL, F-38000 Grenoble, France
关键词
FIELD-EFFECT TRANSISTOR; SCHOTTKY-BARRIER DIODES; BREAKDOWN VOLTAGE; POLYCRYSTALLINE DIAMOND; ON-RESISTANCE; PN DIODE; PERFORMANCE; OPERATION; SURFACE; FABRICATION;
D O I
10.1016/j.mssp.2018.01.007
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Diamond is known as an ultimate material because of its superior properties and it is expected to be employed in next-generation power electronic devices. Progress in epitaxial growth and fabrication techniques such as p- and n-type doping control with low compensation and surface treatment have improved the performance of power devices. High forward-current density and long-term stability have been achieved for Schottky barrier diodes operating at 400 degrees C. Fast turn-off operation with low loss and a high blocking capability of > 10 kV have also been realized. In addition, high blocking voltages of more than 2 kV have been achieved for switching devices such as metal-semiconductor field-effect transistors (MESFETs) and metal-oxide semiconductor FETs. To maximize device performance up to the material limit requires the development of fabrication techniques such as selective area doping, lithography, etching, formation of diamond/oxide interfaces and also defect reduction. Here, the current status of semiconductor diamond technology is reviewed.
引用
收藏
页码:147 / 156
页数:10
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