Recent advances in diamond power semiconductor devices
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作者:
Umezawa, Hitoshi
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机构:
Natl Inst Adv Ind Sci & Technol, Adv Power Elect Res Ctr, Osaka 5638577, Japan
Univ Grenoble Alpes, Inst NEEL, F-38000 Grenoble, France
CNRS, Inst NEEL, F-38000 Grenoble, FranceNatl Inst Adv Ind Sci & Technol, Adv Power Elect Res Ctr, Osaka 5638577, Japan
Umezawa, Hitoshi
[1
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机构:
[1] Natl Inst Adv Ind Sci & Technol, Adv Power Elect Res Ctr, Osaka 5638577, Japan
[2] Univ Grenoble Alpes, Inst NEEL, F-38000 Grenoble, France
Diamond is known as an ultimate material because of its superior properties and it is expected to be employed in next-generation power electronic devices. Progress in epitaxial growth and fabrication techniques such as p- and n-type doping control with low compensation and surface treatment have improved the performance of power devices. High forward-current density and long-term stability have been achieved for Schottky barrier diodes operating at 400 degrees C. Fast turn-off operation with low loss and a high blocking capability of > 10 kV have also been realized. In addition, high blocking voltages of more than 2 kV have been achieved for switching devices such as metal-semiconductor field-effect transistors (MESFETs) and metal-oxide semiconductor FETs. To maximize device performance up to the material limit requires the development of fabrication techniques such as selective area doping, lithography, etching, formation of diamond/oxide interfaces and also defect reduction. Here, the current status of semiconductor diamond technology is reviewed.
机构:
Xidian Univ, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Shaanxi, Peoples R ChinaXidian Univ, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Shaanxi, Peoples R China
Duan, Baoxing
Yang, Yintang
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Xidian Univ, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Shaanxi, Peoples R ChinaXidian Univ, Key Lab, Minist Educ Wide Band Gap Semicond Mat & Devices, Sch Microelect, Xian 710071, Shaanxi, Peoples R China
机构:
Hong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
Southern Univ Sci & Technol, Sch Microelect, Shenzhen 518055, Guangdong, Peoples R ChinaHong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
He, Jiaqi
Cheng, Wei-Chih
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Southern Univ Sci & Technol, Sch Microelect, Shenzhen 518055, Guangdong, Peoples R China
Hong Kong Univ Sci & Technol, Dept Elect & Comp Engn, Hong Kong 999077, Peoples R ChinaHong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
Cheng, Wei-Chih
Wang, Qing
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机构:
Southern Univ Sci & Technol, Minist Educ, Sch Microelect, Engn Res Ctr Integrated Circuits Next Generat Com, Shenzhen 518055, Guangdong, Peoples R ChinaHong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
Wang, Qing
Cheng, Kai
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机构:
Enkris Semicond, Suzhou 215028, Jiangsu, Peoples R ChinaHong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
Cheng, Kai
Yu, Hongyu
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机构:
Southern Univ Sci & Technol, Minist Educ, Sch Microelect, Engn Res Ctr Integrated Circuits Next Generat Com, Shenzhen 518055, Guangdong, Peoples R ChinaHong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
Yu, Hongyu
Chai, Yang
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机构:
Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong 999077, Peoples R ChinaHong Kong Polytech Univ, Dept Elect & Informat Engn, Hong Kong 999077, Peoples R China
机构:
Xidian Univ, Sch Microelect, Minist Educ Wide Band Gap Semicond Mat & Devices, Key Lab, Xian, Shaanxi, Peoples R ChinaXidian Univ, Sch Microelect, Minist Educ Wide Band Gap Semicond Mat & Devices, Key Lab, Xian, Shaanxi, Peoples R China
Duan, Baoxing
Yang, Yintang
论文数: 0引用数: 0
h-index: 0
机构:
Xidian Univ, Sch Microelect, Minist Educ Wide Band Gap Semicond Mat & Devices, Key Lab, Xian, Shaanxi, Peoples R ChinaXidian Univ, Sch Microelect, Minist Educ Wide Band Gap Semicond Mat & Devices, Key Lab, Xian, Shaanxi, Peoples R China