Luminescence characterization of ultrathin MgO films of high crystallinity prepared by pulsed laser deposition

被引：20

作者：

Feldbach, Eduard ^{[1
]}

Jaaniso, Raivo ^{[1
]}

Kodu, Margus ^{[1
]}

Denks, Viktor P. ^{[1
]}

Kasikov, Aarne ^{[1
]}

Liblik, Peeter ^{[1
]}

Maaroos, Aarne ^{[1
]}

Maendar, Hugo ^{[1
]}

Kirm, Marco ^{[1
]}

机构：

[1] Univ Tartu, Inst Phys, EE-51014 Tartu, Estonia

来源：

JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS | 2009年 / 20卷

关键词：

OPTICAL-SURFACE PROPERTIES; MAGNESIUM-OXIDE; SYNCHROTRON RADIATION; SINGLE-CRYSTALS; F+-CENTERS; EXCITATION; EXCITONS; NANOCRYSTALS; DEPENDENCE; CREATION;

D O I：

10.1007/s10854-008-9599-z

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Thin MgO films with thicknesses ranging from 127 to 35 nm were prepared by pulsed laser deposition on Si substrates. The crystalline films were smooth (rms roughness 0.6-1.2 nm) with an average density of 3.5 g/cm(3). Cathodoluminescence study revealed emissions peaked at 7.65 eV and ascribed to the edge emission of large radius exciton states as well as luminescence due to the F and F(+) colour centres in the range of 2-4 eV. This luminescence is efficiently excited in the absorption band peaked at 6.2 eV and in the intrinsic absorption with the onset at 7.4 eV via energy transfer processes.

引用

页码：321 / 325

页数：5