共 22 条
Microstructure evolution during annealing of an amorphous TiAl sheet
被引:21
作者:
Senkov, ON
[1
]
Uchic, MD
[1
]
机构:
[1] USAF, Res Lab, Mat & Mfg Directorate, MLLMD, Wright Patterson AFB, OH 45433 USA
来源:
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
|
2003年
/
340卷
/
1-2期
关键词:
physical vapor deposition;
differential thermal analysis;
X-ray diffraction;
amorphous materials;
titanium aluminide;
phase transformations;
D O I:
10.1016/S0921-5093(02)00189-2
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
An amorphous, 150 mum thick freestanding sheet of a TiAl-based alloy was produced by physical vapor deposition (PVD). The following phase transformations were observed after different stages of crystallization of the amorphous sheet and analyzed using differential thermal analysis, X-ray diffraction, and transmission electron microscopy: amorphous-->body centered cubic (beta) --> hexagonal close-packed (alpha)?--> tetragonal (gamma) + ordered alpha(2). The beta phase was formed as near-spherical particles that were evenly distributed in the amorphous phase and the size of these particles was approximately 90 nm. Formation of the a phase by decomposition of a and the remaining amorphous phases led to a very fine feathery-like microstructure arranged in colonies of approximately 100 nm in size. Interface boundaries between the a phase particles were poorly defined. The transformation of the metastable alpha phase into a mixture of the gamma and alpha(2) phases led to formation of an equiaxed gamma-grain structure with the grain size of approximately 150 nm. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:216 / 224
页数:9
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