Microstructure evolution during annealing of an amorphous TiAl sheet

被引:21
作者
Senkov, ON [1 ]
Uchic, MD [1 ]
机构
[1] USAF, Res Lab, Mat & Mfg Directorate, MLLMD, Wright Patterson AFB, OH 45433 USA
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2003年 / 340卷 / 1-2期
关键词
physical vapor deposition; differential thermal analysis; X-ray diffraction; amorphous materials; titanium aluminide; phase transformations;
D O I
10.1016/S0921-5093(02)00189-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
An amorphous, 150 mum thick freestanding sheet of a TiAl-based alloy was produced by physical vapor deposition (PVD). The following phase transformations were observed after different stages of crystallization of the amorphous sheet and analyzed using differential thermal analysis, X-ray diffraction, and transmission electron microscopy: amorphous-->body centered cubic (beta) --> hexagonal close-packed (alpha)?--> tetragonal (gamma) + ordered alpha(2). The beta phase was formed as near-spherical particles that were evenly distributed in the amorphous phase and the size of these particles was approximately 90 nm. Formation of the a phase by decomposition of a and the remaining amorphous phases led to a very fine feathery-like microstructure arranged in colonies of approximately 100 nm in size. Interface boundaries between the a phase particles were poorly defined. The transformation of the metastable alpha phase into a mixture of the gamma and alpha(2) phases led to formation of an equiaxed gamma-grain structure with the grain size of approximately 150 nm. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:216 / 224
页数:9
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