A persistent diagnostic technique for unstable defects

被引：65

作者：

Sato, Y ^{[1
]}

Yamazaki, I ^{[1
]}

Yamanaka, H ^{[1
]}

Ikeda, T ^{[1
]}

Takakura, M ^{[1
]}

机构：

[1] Hitachi Ltd, Device Dev Ctr, Tokyo, Japan

来源：

INTERNATIONAL TEST CONFERENCE 2002, PROCEEDINGS | 2002年

关键词：

D O I：

10.1109/TEST.2002.1041766

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

We present a persistent diagnostic technique for unstable defects, such as open defects or delay defects. A new "segment model" diagnosis for the completely open defects will be discussed. Here, we not only focus on the behavior of the principal offender, but also the behavior of the accomplices which cause the unstable behavior of the defect. In this paper, a technique using the layout information for an open fault diagnosis, and a testing method for the delay fault will be discussed. Some experimental results of actual chips will be shown.

引用

页码：242 / 249

页数：8

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