A Total Internal Reflection Photoconductive Switch

被引:26
作者
Bora, Mihail [1 ]
Voss, Lars F. [1 ]
Grivickas, Paulius V. [1 ]
Hall, David L. [1 ]
Alameda, Jennifer B. [1 ]
Kramer, Noah J. [1 ]
Torres, Andrea M. [1 ]
Conway, Adam M. [1 ]
机构
[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA
关键词
Optical trapping; photoconductivity; silicon carbide; total internal reflection; PERFORMANCE;
D O I
10.1109/LED.2019.2903926
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We demonstrate a novel illumination technique for extrinsic photoconductive switches based on the creation of a total internal reflection trap to increase the optical path length. The optimal geometry is a square substrate illuminated from one of the corners along the diagonal, ensuringthat the total internal reflection condition is maintained after any reflection off the device lateral sides. The optical absorption uniformity throughout the device bulk was improved by designing the entry window to have a cylindrical shape and by using a square core optical fiber as an illumination source. The concept is experimentally validated on a vanadium-doped silicon carbide device that shows approximately four-fold improvement in responsivity compared to normal illumination.
引用
收藏
页码:734 / 737
页数:4
相关论文
共 13 条
[1]   All solid-state high power microwave source with high repetition frequency [J].
Bragg, J. -W. B. ;
Sullivan, W. W., III ;
Mauch, D. ;
Neuber, A. A. ;
Dickens, J. C. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2013, 84 (05)
[2]   Performance of a Vertical 4H-SiC Photoconductive Switch With AZO Transparent Conductive Window and Silver Mirror Reflector [J].
Cao, Penghui ;
Huang, Wei ;
Guo, Hui ;
Zhang, Yuming .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2018, 65 (05) :2047-2051
[3]   Contact Extensions Over a High-k Dielectric Layer for Surface Field Mitigation in High Power 4H-SiC Photoconductive Switches [J].
Chowdhury, Animesh Roy ;
Mauch, Daniel ;
Joshi, Ravi P. ;
Neuber, Andreas A. ;
Dickens, James .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (08) :3171-3176
[4]   Broadband magnetometry and temperature sensing with a light-trapping diamond waveguide [J].
Clevenson, Hannah ;
Trusheim, Matthew E. ;
Teale, Carson ;
Schroeder, Tim ;
Braje, Danielle ;
Englund, Dirk .
NATURE PHYSICS, 2015, 11 (05) :393-397
[5]   A New Method of Accurately Measuring Photoconductive Performance of 4H-SiC Photoconductive Switches [J].
Han, Wei-Wei ;
Huang, Wei ;
Zhuo, Shi-Yi ;
Xin, Jun ;
Liu, Xue-Chao ;
Shi, Er-Wei ;
Zhang, Yue-Fan ;
Cao, Peng-Hui ;
Wang, Yu-Tian ;
Guo, Hui ;
Zhang, Yu-Ming .
IEEE ELECTRON DEVICE LETTERS, 2019, 40 (02) :271-274
[6]   ON THE COMPENSATION MECHANISM IN HIGH-RESISTIVITY 6H-SIC DOPED WITH VANADIUM [J].
JENNY, JR ;
SKOWRONSKI, M ;
MITCHEL, WC ;
HOBGOOD, HM ;
GLASS, RC ;
AUGUSTINE, G ;
HOPKINS, RH .
JOURNAL OF APPLIED PHYSICS, 1995, 78 (06) :3839-3842
[7]   ON-state characteristics of a high-power photoconductive switch fabricated from compensated 6-H silicon carbide [J].
Kelkar, Kapil S. ;
Islam, Naz E. ;
Kirawanich, Phumin ;
Fessler, Christopher M. ;
Nunnally, William C. .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 2008, 36 (01) :287-292
[8]   Measurement of high-field electron transport in silicon carbide [J].
Khan, IA ;
Cooper, JA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2000, 47 (02) :269-273
[9]   High Power Lateral Silicon Carbide Photoconductive Semiconductor Switches and Investigation of Degradation Mechanisms [J].
Mauch, Daniel ;
Sullivan, William, III ;
Bullick, Alan ;
Neuber, Andreas ;
Dickens, James .
IEEE TRANSACTIONS ON PLASMA SCIENCE, 2015, 43 (06) :2021-2031
[10]   THz generation using extrinsic photoconductivity at 1550 nm [J].
Middendorf, J. R. ;
Brown, E. R. .
OPTICS EXPRESS, 2012, 20 (15) :16504-16509