How to optically count graphene layers

被引：24

作者：

Cheon, Sosan ^{[1
]}

Kihm, Kenneth David ^{[1
,2
]}

Park, Jae Sung ^{[1
]}

Lee, Joon Sik ^{[1
]}

Lee, Byeong Jun ^{[3
]}

Kim, Hyeoungkeun ^{[4
]}

Hong, Byung Hee ^{[5
]}

机构：

[1] Seoul Natl Univ, World Class Univ Program, Seoul 151744, South Korea

[2] Univ Tennessee, Knoxville, TN 37996 USA

[3] Yeungnam Univ, Gyongsan 712749, Gyeongbuk, South Korea

[4] Korea Elect Technol Inst, Elect Mat & Device Res Ctr, Songnam 463816, South Korea

[5] Seoul Natl Univ, Dept Chem, Seoul 151742, South Korea

来源：

OPTICS LETTERS | 2012年 / 37卷 / 18期

基金：

新加坡国家研究基金会;

关键词：

PLASMON RESONANCE REFLECTANCE; REFRACTIVE-INDEX; FIELD; SPECTROSCOPY; CONSTANTS; METALS; FILMS;

D O I：

10.1364/OL.37.003765

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The total thickness of a graphene sample depends upon the number of individually stacked graphene layers. The corresponding surface plasmon resonance (SPR) reflectance alters the SPR angle, depending on the number of graphene layers. Thus, the correlation between the SPR angle shift and the number of graphene layers allows for a nonintrusive, real-time, and reliable counting of graphene layers. A single-layer graphene (SLG) is synthesized by means of chemical vapor deposition, followed by physical transfer to a thin gold film (48 nm) repeatedly, so that multilayer graphene samples with one, three, and five layers can be prepared. Both the measured SPR angles and the entire reflectance curve profiles successfully distinguish the number of graphene layers. (C) 2012 Optical Society of America

引用

页码：3765 / 3767

页数：3

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