High-Temperature Endurable Encapsulation Material

被引:0
作者
Chidambaram, Vivek [1 ]
Yeung, Ho Beng [1 ]
Sing, Chan Yuen [1 ]
MinWoo, Daniel Rhee [1 ]
机构
[1] ASTAR, Inst Microelect, Singapore 117685, Singapore
来源
PROCEEDINGS OF THE 2012 IEEE 14TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE | 2012年
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The accomplishment of fully functional high-pressure high-temperature (HPHT) well is possible only, when the packaging and interconnections in the well logging equipments can survive at higher temperatures. Currently, there are numerous choices for substrate materials and interconnection materials, However, there are hardly any encapsulation materials that can endure at 300 degrees C, Thus, the limiting factor for the evaluation and monitoring of IIPIIT wells is; the availability of high-temperature endurable encapsulation material. In this paper, the endurability of three prospective candidates for high-temperature encapsulation have been characterized and reported. The three prospective candidates are benzocyclobutene (BCB), ceramic filled cyanate ester and quartz filled cyanate ester. The high-temperature endurability has been evaluated in this work by high-temperature storage at 300 degrees C up to 500 hours. Adhesion strength of these prospective candidates with the alumina ceramic substrate and the Si die was verified by room shear testing and hot shear testing. It has been determined that the quartz filled cyanate ester could comply with the minimum indispensable requirement for this application, when sandwiched between alumina ceramic substrates, despite the loss of strength during long-term thermal aging at 300 degrees C. The material degradation has been studied in this work, using thermo-gavimetric analysis.
引用
收藏
页码:61 / 66
页数:6
相关论文
共 3 条
[1]  
Amalu E. H., 2009, 2009 2nd International Conference on Adaptive Science & Technology (ICAST 2009), P146, DOI 10.1109/ICASTECH.2009.5409731
[2]   Development of Metallic Hermetic Sealing for MEMS Packaging for Harsh Environment Applications [J].
Chidambaram, Vivek ;
Yeung, Ho Beng ;
Shan, Gao .
JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (08) :2256-2266
[3]   Reliability of Au-Ge and Au-Si Eutectic Solder Alloys for High-Temperature Electronics [J].
Chidambaram, Vivek ;
Yeung, Ho Beng ;
Shan, Gao .
JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (08) :2107-2117