Shot Noise Suppression in Single Electron Transistors

被引：3

作者：

Babiker, Sharief F. ^{[1
]}

Naeem, Rania ^{[1
]}

机构：

[1] Univ Khartoum, Dept Elect & Elect Engn, Khartoum, Sudan

来源：

IEEE TRANSACTIONS ON NANOTECHNOLOGY | 2012年 / 11卷 / 06期

关键词：

Correlation; noise; single electron transistors (SETs); tunneling; COULOMB-BLOCKADE; ENVIRONMENT;

D O I：

10.1109/TNANO.2012.2223713

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Shot noise in a single electron transistor coupled to a dissipative environment is studied. The evolution of the charging process is modeled using classical circuit equations. The distribution of time between tunnel events in the presence of series coupling resistances is derived and used in modeling the stochastic tunneling processes. It is shown that resistive series elements result in a suppression of the Fano factor, below the theoretical 0.5 limit.

引用

页码：1267 / 1272

页数：6

共 24 条

[1] Giant suppression of shot noise as signature of coherent transport in double barrier resonant diodes [J].

Aleshkin, VY ;

Reggiani, L ;

Alkeev, NV ;

Lyubchenko, VE ;

Ironside, CN ;

Figueiredo, JML ;

Stanley, CR .

SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2004, 19 (04) :S161-S163

[2] CHARGE SOLITONS IN 1-D ARRAY OF MESOSCOPIC TUNNEL-JUNCTIONS [J].

AMMAN, M ;

BENJACOB, E ;

MULLEN, K .

PHYSICS LETTERS A, 1989, 142 (6-7) :431-437

[3] Simulation of single-electron transport in nanostructured quantum dots [J].

Babiker, S .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (03) :392-396

[4] SHOT-NOISE SUPPRESSION IN THE SINGLE-ELECTRON TUNNELING REGIME [J].

BIRK, H ;

DEJONG, MJM ;

SCHONENBERGER, C .

PHYSICAL REVIEW LETTERS, 1995, 75 (08) :1610-1613

[5] TRAVERSAL TIME FOR TUNNELING [J].

BUTTIKER, M ;

LANDAUER, R .

IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (05) :451-454

[6] Electron Counting Capacitance Standard with an improved five-junction R-pump [J].

Camarota, Benedetta ;

Scherer, Hansjoerg ;

Keller, Mark W. ;

Lotkhov, Sergey V. ;

Willenberg, Gerd-Dietmar ;

Ahlers, Franz Josef .

METROLOGIA, 2012, 49 (01) :8-14

[7] INFLUENCE OF THE ENVIRONMENT ON THE COULOMB BLOCKADE IN SUBMICROMETER NORMAL-METAL TUNNEL-JUNCTIONS [J].

CLELAND, AN ;

SCHMIDT, JM ;

CLARKE, J .

PHYSICAL REVIEW B, 1992, 45 (06) :2950-2961

[8] EFFECT OF THE ELECTROMAGNETIC ENVIRONMENT ON THE COULOMB BLOCKADE IN ULTRASMALL TUNNEL-JUNCTIONS [J].

DEVORET, MH ;

ESTEVE, D ;

GRABERT, H ;

INGOLD, GL ;

POTHIER, H ;

URBINA, C .

PHYSICAL REVIEW LETTERS, 1990, 64 (15) :1824-1827

[9] ZERO-FREQUENCY CURRENT NOISE FOR THE DOUBLE-TUNNEL-JUNCTION COULOMB BLOCKADE [J].

HERSHFIELD, S ;

DAVIES, JH ;

HYLDGAARD, P ;

STANTON, CJ ;

WILKINS, JW .

PHYSICAL REVIEW B, 1993, 47 (04) :1967-1979

[10]

Hoai Nam N, 2006, COMMUN PHYS, V16, P193

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