OBT for settling error test of sampled-data systems using signal-dependent clocking

被引：0

作者：

Barragan, Manuel J. ^{[1
]}

Leger, Gildas

Huertas, Jose L.

机构：

[1] CSIC, Ctr Nacl Microelect, Inst Microlectron Sevilla, Av Amer Vespucio S-N, Seville 41092, Spain

来源：

2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) | 2012年

关键词：

OSCILLATION-BASED-TEST; PREDICTION;

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This work presents a modification of traditional Oscillation-Based Test schemes for sampled-data systems. This new test scheme is based on doubling the sampling frequency when the oscillation changes its sign. This way, the DC level of the output oscillation signal becomes a simple signature sensitive to the settling errors in the device under test and to its oscillation features. The proposed technique is illustrated on a switched-capacitor second-order lowpass filter. This case study is used to show the sensitivity of the proposed signature to the linearity of the DUT. Electrical simulation results are provided to validate the proposal.

引用

页数：6

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