Left-handed material anisotropy effect on guided wave electromagnetic fields
被引:24
作者:
Krowne, CM
论文数: 0引用数: 0
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机构:
USN, Res Lab, Microwave Technol Branch, Div Elect Sci & Technol, Washington, DC 20375 USAUSN, Res Lab, Microwave Technol Branch, Div Elect Sci & Technol, Washington, DC 20375 USA
Krowne, CM
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机构:
[1] USN, Res Lab, Microwave Technol Branch, Div Elect Sci & Technol, Washington, DC 20375 USA
Effect of anisotropy on the physical tensor description of the negative index of refraction material acting as a substrate is found on the electromagnetic field distributions. This is done for the case of a microstrip structure, whose configuration is commonly used in microwave and millimeter wave integrated circuits. These ab initio studies have been done self-consistently with a computer code using a full-wave integral equation numerical method based on generalized Green's function utilizing appropriate boundary conditions. Field distributions are provided over two decades of frequency in the cross section of the uniform guided wave structure, from 0.2 to 20 GHz. It is found that modifying the tensor can allow control because the wave changes volumetrically, or switches from volumetric to surface, in its distribution of fields.
机构:
USN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USAUSN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USA
机构:
USN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USAUSN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USA
机构:
USN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USAUSN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USA
机构:
USN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USAUSN, Microwave Technol Branch, Div Elect Sci & Technol, Res Lab, Washington, DC 20375 USA