The Method of a Fast Electrothermal Transient Analysis of Single-Inductance DC-DC Converters

被引：36
作者：
Gorecki, Krzysztof [1 ]
Zarebski, Janusz [1 ]
机构：
[1] Gdynia Maritime Univ, Dept Marine Elect, PL-81225 Gdynia, Poland
来源：
IEEE TRANSACTIONS ON POWER ELECTRONICS | 2012年 / 27卷 / 09期
关键词：
Convolution algorithms; dc-dc converters; electrothermal analysis; TIME-DOMAIN ANALYSIS; CONVOLUTION ALGORITHMS; THERMAL-MODEL; POWER; SIMULATION; NETWORKS;
D O I：
10.1109/TPEL.2012.2188546
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper, a new method for fast estimation of the characteristics of single-inductance dc-dc converters at the steady state with self-heating taken into account is proposed. This method is based on the special memoryless convolution algorithm. The method is described in detail. The theoretical considerations are illustrated with simulation results of buck and boost converters.
引用
收藏
页码：4005 / 4012
页数：8
相关论文
共 43 条
  • [1] Thermal resistance analysis by induced transient (TRAIT) method for power electronic devices thermal characterization - Part I: Fundamentals and theory
    Bagnoli, PE
    Casarosa, C
    Ciampi, M
    Dallago, E
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 1998, 13 (06) : 1208 - 1219
  • [2] Basso C., 2001, Switch-Mode Power Supply Spice Cookbook
  • [3] TIME-DOMAIN ANALYSIS OF NETWORKS WITH INTERNALLY CONTROLLED SWITCHES
    BEDROSIAN, D
    VLACH, J
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 1992, 39 (03): : 199 - 212
  • [4] ANALYSIS OF SWITCHED NETWORKS
    BEDROSIAN, D
    VLACH, J
    [J]. INTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, 1992, 20 (03) : 309 - 325
  • [5] Analysis of switching effects in DC-DC converters via bias point computation
    Biolek, Dalibor
    Biolkova, Viera
    Kolka, Zdenek
    [J]. 2007 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN, VOLS 1-3, 2007, : 1006 - +
  • [6] Biolek D, 2007, 2007 17TH INTERNATIONAL CONFERENCE RADIOELEKTRONIKA, VOLS 1 AND 2, P168
  • [7] TRANSIENT THERMAL RESPONSE MEASUREMENTS OF POWER TRANSISTORS
    BLACKBURN, DL
    OETTINGER, FF
    [J]. IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS AND CONTROL INSTRUMENTATION, 1975, IE22 (02): : 134 - 141
  • [8] Bryant AT, 2006, IEEE IND APPLIC SOC, P1465
  • [9] Reliability analysis and modeling of power MOSFETs in the 42-V-PowerNet
    Castellazzi, Alberto
    Gerstenmaier, York C.
    Wachutka, Gerhard K. M.
    [J]. IEEE TRANSACTIONS ON POWER ELECTRONICS, 2006, 21 (03) : 603 - 612
  • [10] Chua LO, 1975, COMPUTER AIDED ANAL
12345