Analysis of mode coupling due to spherical defects in ideal fully metal-coated scanning near-field optical microscopy probes

被引：9

作者：

Nakagawa, W ^{[1
]}

Vaccaro, L ^{[1
]}

Herzig, HP ^{[1
]}

机构：

[1] Univ Neuchatel, Inst Microtechnol, CH-2000 Neuchatel, Switzerland

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION | 2006年 / 23卷 / 05期

关键词：

D O I：

10.1364/JOSAA.23.001096

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We investigate the effect of defects in the metal-coating layer of a scanning near-field optical microscopy (SNOM) probe on the coupling of polarization modes using rigorous electromagnetic modeling tools. Because of practical limitations, we study an ensemble of simple defects to identify important trends and then extrapolate these results to more realistic structures. We find that a probe with many random defects will produce a small but significant coupling of energy between a linearly polarized input mode and a radial/longitudinal polarization mode, which is known to produce a strongly localized emitted optical field and is desirable for SNOM applications. (C) 2006 Optical Society of America.

引用

页码：1096 / 1105

页数：10

共 13 条

[1] Characterization and fabrication of fully metal-coated scanning near-field optical microscopy SiO2 tips [J].

Aeschimann, L ;

Akiyama, T ;

Staufer, U ;

De Rooij, NF ;

Thiery, L ;

Eckert, R ;

Heinzelmann, H .

JOURNAL OF MICROSCOPY-OXFORD, 2003, 209 :182-187

[2] Analysis of the interferometric effect of the background light in apertureless scanning near-field optical microscopy [J].

Aubert, S ;

Bruyant, A ;

Blaize, S ;

Bachelot, R ;

Lerondel, G ;

Hudlet, S ;

Royer, P .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 2003, 20 (10) :2117-2124

[3] Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip [J].

Bachelot, R ;

Gleyzes, P ;

Boccara, AC .

APPLIED OPTICS, 1997, 36 (10) :2160-2170

[4] Field enhancement in apertureless near-field scanning optical microscopy [J].

Bohn, JL ;

Nesbitt, DJ ;

Gallagher, A .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2001, 18 (12) :2998-3006

[5] Collection of transverse and longitudinal fields by means of apertureless nanoprobes with different metal coating characteristics [J].

Descrovi, E ;

Vaccaro, L ;

Nakagawa, W ;

Aeschimann, L ;

Staufer, U ;

Herzig, HP .

APPLIED PHYSICS LETTERS, 2004, 85 (22) :5340-5342

[6] Optical properties of microfabricated fully-metal-coated near-field probes in collection mode [J].

Descrovi, E ;

Vaccaro, L ;

Aeschimann, L ;

Nakagawa, W ;

Staufer, U ;

Herzig, HP .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2005, 22 (07) :1432-1441

[7] Near-field fluorescence imaging with 32 nm resolution based on microfabricated cantilevered probes [J].

Eckert, R ;

Freyland, JM ;

Gersen, H ;

Heinzelmann, H ;

Schürmann, G ;

Noell, W ;

Staufer, U ;

de Rooij, NF .

APPLIED PHYSICS LETTERS, 2000, 77 (23) :3695-3697

[8] Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling [J].

Fikri, R ;

Grosges, T ;

Barchiesi, D .

OPTICS LETTERS, 2003, 28 (22) :2147-2149

[9] Influence of secondary tip shape on illumination-mode near-field scanning optical microscopy images [J].

Richter, LJ ;

Jordan, CE ;

Cavanagh, RR ;

Bryant, GW ;

Liu, AS ;

Stranick, SJ ;

Keating, CD ;

Natan, MJ .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1999, 16 (08) :1936-1946

[10] Fabrication and characterization of a silicon cantilever probe with an integrated quartz-glass (fused-silica) tip for scanning near-field optical microscopy [J].

Schürmann, G ;

Noell, W ;

Staufer, U ;

de Rooij, NF ;

Eckert, R ;

Freyland, JM ;

Heinzelmann, H .

APPLIED OPTICS, 2001, 40 (28) :5040-5045

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