Dependence of X-ray diffraction patterns on the parameters of primary incident beam

X-ray diffraction patterns obtained from a plane-parallel crystalline plate with a spherical cavity and from a wedge-shaped crystal have been investigated depending on the collimation of the primary incident beam. It is shown that in the case of ribbon-like incident beam the sectional topograms, obtained from the wedge-shaped crystal, have the form of V-shaped or straight fringes depending on the orientation of reflecting planes relative to the surface of the X-ray ribbon-like beam. In the case of a wide parallel beam or an asymmetrically reflected wide monochromatic beam the parallel fringes are obtained from the wedge-shaped crystals, and the circular fringes are obtained from the plane-parallel crystalline plates with a spherical cavity. For the primary ribbon-like beam the V-shaped patterns acquire the form of circular fringes as a result of scanning the crystal with a spherical cavity and the X-ray film.