An accurate experimental method for characterizing transmission lines embedded in multilayer printed circuit boards

被引：22

作者：

Narita, K ^{[1
]}

Kushta, T ^{[1
]}

机构：

[1] NEC Corp Ltd, Jisso & Prod Technol Res Labs, Kanagawa 2291198, Japan

来源：

IEEE TRANSACTIONS ON ADVANCED PACKAGING | 2006年 / 29卷 / 01期

关键词：

characteristic impedance; propagation constant; strip line; through holes; vias;

D O I：

10.1109/TADVP.2005.849543

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have developed an accurate method for measuring the complex propagation constant and characteristic impedance of transmission lines embedded in multilayer printed circuit boards. It is based on mathematical error-removal schemes using two different length transmission lines and an advanced via-hole structure that minimizes coupling. Consequently, associated errors, due to discontinuities and interference can be effectively eliminated, and the frequency dependencies of the transmission line parameters can be clarified in wide frequency bandwidths. We verified the validity of this method in frequency ranges up to at least 48 GHz, by comparing the determined values with the theory derived from transverse electromagnetic (TEM) approximations.

引用

页码：114 / 121

页数：8

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