Decoupling of geometric thickness and refractive index in quantitative phase microscopy

被引：22

作者：

Cardenas, Nelson ^{[1
]}

Mohanty, Samarendra ^{[1
]}

机构：

[1] Univ Texas Arlington, Dept Phys, Biophys & Physiol Lab, Arlington, TX 76019 USA

来源：

OPTICS LETTERS | 2013年 / 38卷 / 06期

关键词：

CONTRAST; COMPENSATION; DYNAMICS; LIQUIDS;

D O I：

10.1364/OL.38.001007

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In quantitative phase imaging, a priori knowledge of either refractive index or physical thickness is used to estimate the change in one of these parameters. Here, we report a method for decoupling geometric thickness from refractive index in quantitative phase microscopy. (C) 2013 Optical Society of America

引用

页码：1007 / 1009

页数：3

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