160 MS/s 20 MHz bandwidth third-order noise shaping SAR ADC

被引：12

作者：

Ghaedrahmati, Hanie ^{[1
]}

Zhou, Jianjun ^{[1
]}

机构：

[1] Shanghai Jiao Tong Univ, CARFIC Lab, SEIEE, Shanghai, Peoples R China

来源：

ELECTRONICS LETTERS | 2018年 / 54卷 / 03期

关键词：

analogue-digital conversion; operational amplifiers; passive networks; comparators (circuits); thermal noise; digital-analogue conversion; CMOS integrated circuits; low-power electronics; third-order noise shaping SAR ADC; operational-amplifier; embedded passive gain technique; noise shaping successive approximation register; comparator noise; quantisation noise; settling error; DAC thermal noise; CMOS technology; passive element; capacitor; switch; oversampling scheme; shaping scheme; bandwidth; 20; MHz; size; 40; nm;

D O I：

10.1049/el.2017.3969

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This Letter proposes an operational-amplifier free with an embedded passive gain technique to implement an oversampling, noise shaping successive approximation register (SAR) ADCs. In the proposed scheme, the comparator noise, quantisation noise, settling errors and DAC thermal noise are alleviated. A third-order noise shaping SAR ADC with inserted passive gain design in 40 nm CMOS technology is well suited for low power application because of using passive elements like capacitors and switches. Due to the oversampling and shaping scheme, the structure can be used for high-speed and high-resolution operation.

引用

页码：128 / 130

页数：2

共 5 条

[1] A Low-Power Capacitive Charge Pump Based Pipelined ADC
Ahmed, Imran
Mulder, Jan
Johns, David A.
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2010, 45 (05) : 1016 - 1027
[2] Chen ZJ, 2016, IEEE ASIAN SOLID STA, P309, DOI 10.1109/ASSCC.2016.7844197
[3] A 90-MS/s 11-MHz-Bandwidth 62-dB SNDR Noise-Shaping SAR ADC
Fredenburg, Jeffrey A.
Flynn, Michael P.
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2012, 47 (12) : 2898 - 2904
[4] Fully passive third-order noise shaping SAR ADC
Payandehnia, P.
Mirzaie, H.
Maghami, H.
Muhlestein, J.
Temes, G. C.
[J]. ELECTRONICS LETTERS, 2017, 53 (08) : 528 - 530
[5] Zhijie Chen, 2015, 2015 Symposium on VLSI Circuits (VLSI Circuits), pC64, DOI 10.1109/VLSIC.2015.7231329

← 1 →