Growth induced grain boundary plane oscillations in YBa2Cu3O7 thin film bicrystals

被引：0

作者：

Ayache, J ^{[1
]}

Thorel, A

Kim, SJ

Lesueur, J

Westmacott, KH

Dahmen, U

机构：

[1] Univ Paris 11, CNRS, CSNSM, F-91405 Orsay, France

[2] Ecole Mines Paris, Ctr Mat, F-91003 Evry, France

[3] Univ Calif Berkeley, Lawrence Berkeley Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

INTERGRANULAR AND INTERPHASE BOUNDARIES IN MATERIALS, IIB98 | 1999年 / 294-2卷

关键词：

YBCO thin film superconductors; grain boundary; bicrystal; structure;

D O I：

10.4028/www.scientific.net/MSF.294-296.119

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

We have combined TEM (Transmission Electron Microscopy), HREM (High Resolution Electron Microscopy) and AFM (Atomic Force Microscope) techniques to study growth induced defects in YBCO thin film bicrystals. AFM images clearly evidence "in-plane waviness" of the grain boundary (GB) and a quantitative analysis of HREM images shows unambiguously the oscillation of the grain boundary plane, This GB structure and morphology results from the island growth mechanism of the film.

引用

页码：119 / 122

页数：4

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