Structural characterization of self-assembled polypeptide films on titanium and glass surfaces by atomic force microscopy

被引:10
|
作者
Pelsöczi, I
Turzó, K
Gergely, C
Fazekas, A
Dékány, I
Cuisinier, F
机构
[1] Univ Szeged, Dept Dent & Oral Surg, H-6720 Szeged, Hungary
[2] Univ Montpellier 2, Etud Semicond Grp, F-34095 Montpellier, France
[3] Univ Szeged, Dept Colloid Chem, H-6720 Szeged, Hungary
[4] Univ Strasbourg, INSERM U595, F-67085 Strasbourg, France
关键词
D O I
10.1021/bm050360k
中图分类号
Q5 [生物化学]; Q7 [分子生物学];
学科分类号
071010 ; 081704 ;
摘要
Chemically modified biomaterial surfaces (titanium and glass) covered with polyelectro,lyte self-assembled films formed by the alternating adsorption of cationic poly-L-lysine (PLL) and anionic poly-L-glutamic acid (PGA) were structurally characterized by atomic force microscopy. Complementary information concerning the thickness and layer-by-layer growth of the films was provided by optical waveguide light-mode spectroscopy. The frequently used ex situ and the rarely used in situ build-up methods were compared. Important aspects of the industrial applicability of these films, their stability in time, and possible differences in their morphology were investigated. The films revealed a granular pattern, with grain diameters of 270 +/- 87 nm for glass (up to 8 bilayers) and 303 +/- 89 nm for titanium (up to 10 bilayers), independently of the build-up procedure. Both surfaces displayed a rehydration capability, the titanium surface exhibiting a better stability in time. The high roughness values observed at acidic or basic pH are related to the degree of ionization of PGA and PLL.
引用
收藏
页码:3345 / 3350
页数:6
相关论文
共 50 条
  • [31] Electrical transport and mechanical properties of alkylsilane self-assembled monolayers on silicon surfaces probed by atomic force microscopy
    Park, Jeong Young
    Qi, Yabing
    Ashby, Paul D.
    Hendriksen, Bas L. M.
    Salmeron, Miquel
    JOURNAL OF CHEMICAL PHYSICS, 2009, 130 (11):
  • [32] Formation of self-assembled octadecylsiloxane monolayers on mica and silicon surfaces studied by atomic force microscopy and infrared spectroscopy
    Vallant, T
    Brunner, H
    Mayer, U
    Hoffmann, H
    Leitner, T
    Resch, R
    Friedbacher, G
    JOURNAL OF PHYSICAL CHEMISTRY B, 1998, 102 (37): : 7190 - 7197
  • [33] A clay self-assembled on a gold surface as studied by atomic force microscopy and electrochemistry
    Hotta, Y
    Inukai, K
    Taniguchi, M
    Nakata, M
    Yamagishi, A
    LANGMUIR, 1997, 13 (25) : 6697 - 6703
  • [34] Imaging of proteins adsorbed on self-assembled monolayers by atomic force microscopy in liquid
    Umemura, K
    Hara, M
    Sasabe, H
    Knoll, W
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1997, 36 (7B): : L945 - L948
  • [35] Scratching and healing investigations on self-assembled monolayers using Atomic Force Microscopy
    Neves, BRA
    Salmon, ME
    Leonard, DN
    Troughton, EB
    Russell, PE
    MICROBEAM ANALYSIS 2000, PROCEEDINGS, 2000, (165): : 367 - 368
  • [36] Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy
    Ichii, T
    Urabe, M
    Fukuma, T
    Kobayashi, K
    Matsushige, K
    Yamada, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2005, 44 (7B): : 5378 - 5381
  • [37] Self-assembled TPPS4 nanostructures revealed by atomic force Microscopy
    Augulis, R
    Snitka, V
    Rotomskis, R
    SELF FORMATION THEORY AND APPLICATIONS, 2004, 97-98 : 191 - 194
  • [38] Nanoscale wettability of self-assembled monolayers investigated by noncontact atomic force microscopy
    Checco, A
    Schollmeyer, H
    Daillant, J
    Guenoun, P
    Boukherroub, R
    LANGMUIR, 2006, 22 (01) : 116 - 126
  • [39] Self-assembled monolayers of alkanethiol and fluoroalkanethiol investigated by noncontact atomic force microscopy
    Ichii, Takashi
    Urabe, Masashi
    Fukuma, Takeshi
    Kobayashi, Kei
    Matsushige, Kazumi
    Yamada, Hirofumi
    Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2005, 44 (7 B): : 5378 - 5381
  • [40] Investigation of self-assembled Ge islands on Si(001) by atomic force microscopy
    Krasilnik, ZF
    Kruglov, AV
    Novikov, AV
    Postnikov, VV
    Filatov, DO
    IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA, 1999, 63 (02): : 287 - 289