Access Strategies for Resistive Random Access Memory (RRAM)

被引:1
|
作者
Chen, F. T. [1 ]
Chen, Y. -S. [1 ]
Lee, H. -Y. [1 ]
Chen, W. -S. [1 ]
Gu, P. -Y. [1 ]
Wu, T. -Y. [1 ]
Tsai, C. -H. [1 ]
Liao, Y. -Y. [1 ]
Chen, P. -S. [1 ]
Shyuan, S. -S. [1 ]
Chiu, P. -F. [1 ]
Lin, W. -P. [1 ]
Lin, C. -H. [1 ]
Tsai, M. -J. [1 ]
Ku, T. -K. [1 ]
机构
[1] Ind Technol Res Inst, Elect & Optoelect Labs, Hsinchu, Taiwan
关键词
D O I
10.1149/1.3694298
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
In an RRAM array, it is important to avoid sneak current paths that result in inadvertent, non-negligible voltage and current inputs to unselected cells. At the same time, care must be taken not to allow excessive voltages or currents to selected cells, which could result in damage. For this reason, the choice of an appropriate cell access device is crucial. There is a natural tradeoff that a less leaky device is harder to turn ON. Thus, many devices that could provide sufficient ON-OFF ratio would require higher voltages for turning ON. However, too high a turn-ON voltage could result in breakdown of the RRAM due to transfer of the weight of the voltage from the access device to the RRAM. Consequently, the allowable voltage-current window must generally be restricted to fairly low currents and modest ON-OFF ratios. Assessing the compatibility of an RRAM with available access devices is a necessary step before determining the array architecture.
引用
收藏
页码:73 / 78
页数:6
相关论文
共 50 条
  • [21] All Nonmetal Resistive Random Access Memory
    Yen, Te Jui
    Gismatulin, Andrei
    Volodin, Vladimir
    Gritsenko, Vladimir
    Chin, Albert
    SCIENTIFIC REPORTS, 2019, 9 (1)
  • [22] Operation methods of resistive random access memory
    GuoMing Wang
    ShiBing Long
    MeiYun Zhang
    Yang Li
    XiaoXin Xu
    HongTao Liu
    Ming Wang
    PengXiao Sun
    HaiTao Sun
    Qi Liu
    HangBing Lü
    BaoHe Yang
    Ming Liu
    Science China Technological Sciences, 2014, 57 : 2295 - 2304
  • [23] An overview of resistive random access memory devices
    Li YingTao
    Long ShiBing
    Liu Qi
    Lu HangBing
    Liu Su
    Liu Ming
    CHINESE SCIENCE BULLETIN, 2011, 56 (28-29): : 3072 - 3078
  • [24] Operation methods of resistive random access memory
    WANG Guo Ming
    LONG Shi Bing
    ZHANG Mei Yun
    LI Yang
    XU Xiao Xin
    LIU Hong Tao
    WANG Ming
    SUN Peng Xiao
    SUN Hai Tao
    LIU Qi
    Lü Hang Bing
    YANG Bao He
    LIU Ming
    Science China(Technological Sciences), 2014, 57 (12) : 2295 - 2304
  • [25] An overview of resistive random access memory devices
    LI YingTao 1
    2 Laboratory of Nano-Fabrication and Novel Device Integration
    Science Bulletin, 2011, (Z2) : 3072 - 3078
  • [26] Operation methods of resistive random access memory
    WANG Guo Ming
    LONG Shi Bing
    ZHANG Mei Yun
    LI Yang
    XU Xiao Xin
    LIU Hong Tao
    WANG Ming
    SUN Peng Xiao
    SUN Hai Tao
    LIU Qi
    L Hang Bing
    YANG Bao He
    LIU Ming
    Science China(Technological Sciences), 2014, (12) : 2295 - 2304
  • [27] All Nonmetal Resistive Random Access Memory
    Te Jui Yen
    Andrei Gismatulin
    Vladimir Volodin
    Vladimir Gritsenko
    Albert Chin
    Scientific Reports, 9
  • [28] Conductance Quantization in Resistive Random Access Memory
    Li, Yang
    Long, Shibing
    Liu, Yang
    Hu, Chen
    Teng, Jiao
    Liu, Qi
    Lv, Hangbing
    Sune, Jordi
    Liu, Ming
    NANOSCALE RESEARCH LETTERS, 2015, 10
  • [29] Operation methods of resistive random access memory
    Wang GuoMing
    Long ShiBing
    Zhang MeiYun
    Li Yang
    Xu XiaoXin
    Liu HongTao
    Wang Ming
    Sun PengXiao
    Sun HaiTao
    Liu Qi
    Lu HangBing
    Yang BaoHe
    Liu Ming
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2014, 57 (12) : 2295 - 2304
  • [30] MULTI-LEVEL OPERATION OF FULLY CMOS COMPATIBLE WOX RESISTIVE RANDOM ACCESS MEMORY (RRAM)
    Chien, W. C.
    Chen, Y. C.
    Chang, K. P.
    Lai, E. K.
    Yao, Y. D.
    Lin, P.
    Gong, J.
    Tsai, S. C.
    Hsieh, S. H.
    Chen, C. F.
    Hsieh, K. Y.
    Liu, R.
    Lu, Chih-Yuan
    2009 IEEE INTERNATIONAL MEMORY WORKSHOP, 2009, : 15 - +