The omnivorous diet of modern technology

被引:76
作者
Greenfield, Aaron [1 ]
Graedel, T. E. [1 ]
机构
[1] Yale Univ, Ctr Ind Ecol, New Haven, CT 06443 USA
关键词
Jet engines; Magnets; Electronics; Rhenium; Rare earths; DESIGN; DRAM;
D O I
10.1016/j.resconrec.2013.02.010
中图分类号
X [环境科学、安全科学];
学科分类号
08 ; 0830 ;
摘要
Two centuries ago the diet of technology (the diversity of materials utilized) consisted largely of natural materials and a few metals. A century later, the diversity in the diet had expanded to perhaps a dozen materials in common use. In contrast, today's technology employs nearly every material in the periodic table, a behavior illustrated in this paper by the material evolution of electronics, medical technology, and the jet engine. Geological deposits in a given country or region tend to have only minimal to moderate elemental diversity, however. As a result, an extensive and diverse metal trade is required if modern technology is to be sustained. Some recent industry responses to elemental scarcity and implications for corporate and governmental policy are discussed. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:1 / 7
页数:7
相关论文
共 25 条
  • [1] [Anonymous], 2006, The history of nuclear energy, P15
  • [2] Bauer Diana., 2010, CRITICAL MAT STRATEG
  • [3] Donachie M J., 2002, Superalloys: a Technical Guide
  • [4] DESIGN IN AN ERA OF CONSTRAINED RESOURCES
    Duclos, Steven J.
    Otto, Jeffrey P.
    Konitzer, Douglas G.
    [J]. MECHANICAL ENGINEERING, 2010, 132 (09) : 36 - 40
  • [5] E-Magnets UK Limited, INTR NEOD MAGN
  • [6] Enokido Y, 2010, TECHNICAL TRENDS NEO
  • [7] Minimizing and Communicating Radiation Risk in Pediatric Nuclear Medicine
    Fahey, Frederic H.
    Treves, S. Ted
    Adelstein, S. James
    [J]. JOURNAL OF NUCLEAR MEDICINE, 2011, 52 (08) : 1240 - 1251
  • [8] Farrance R, TIMELINE 50 YEARS HA
  • [9] Rhenium Reduction-Alloy Design Using an Economically Strategic Element
    Fink, Paul J.
    Miller, Joshua L.
    Konitzer, Douglas G.
    [J]. JOM, 2010, 62 (01) : 55 - 57
  • [10] Evolution of materials technology for stacked-capacitors in 65 nm embedded-DRAM
    Gerritsen, E
    Emonet, N
    Caillat, C
    Jourdan, N
    Piazza, M
    Fraboulet, D
    Boeck, B
    Berthelot, A
    Smith, S
    Mazoyer, P
    [J]. SOLID-STATE ELECTRONICS, 2005, 49 (11) : 1767 - 1775