Accelerated Test Methods for Reliability Prediction

被引：31

作者：

Collins, David H. ^{[1
]}

Freels, Jason K. ^{[2
]}

Huzurbazar, Aparna V. ^{[1
]}

Warr, Richard L. ^{[2
]}

Weaver, Brian P. ^{[1
]}

机构：

[1] Los Alamos Natl Lab, Los Alamos, NM 87544 USA

[2] Air Force Inst Technol, Wright Patterson AFB, OH 45433 USA

来源：

JOURNAL OF QUALITY TECHNOLOGY | 2013年 / 45卷 / 03期

关键词：

Accelerated Degradation Test; Accelerated Life Test; Design of Experiments; Highly Accelerated Testing; Reliability Analysis; Reliability Growth; DEGRADATION;

D O I：

10.1080/00224065.2013.11917936

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Perusal of quality- and reliability-engineering literature indicates some confusion over the meaning of accelerated life testing (ALT), highly accelerated life testing (HALT), highly accelerated stress screening (HASS), and highly accelerated stress auditing (HASA). In addition, there is a significant conflict between testing as part of an iterative process of finding and removing defects and testing as a means of estimating or predicting product reliability. We review the basics of these testing methods and describe how they relate to statistical methods for estimation and prediction of reliability and reliability growth. We also outline potential synergies to help reconcile statistical and engineering approaches to accelerated testing, resulting in better product quality at lower cost.

引用

页码：244 / 259

页数：16

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