Fabrication and electrical transport properties of binary Co-Si nanostructures prepared by focused electron beam-induced deposition

被引:32
|
作者
Porrati, F. [1 ]
Kaempken, B. [2 ]
Terfort, A. [2 ]
Huth, M. [1 ]
机构
[1] Goethe Univ Frankfurt, Inst Phys, D-60438 Frankfurt, Germany
[2] Goethe Univ Frankfurt, Inst Anorgan & Analyt Chem, D-60438 Frankfurt, Germany
关键词
COBALT SILICIDE; MICROELECTRONICS;
D O I
10.1063/1.4790320
中图分类号
O59 [应用物理学];
学科分类号
摘要
CoSi-C binary alloys have been fabricated by focused electron beam-induced deposition by the simultaneous use of dicobaltoctacarbonyl, Co-2(CO)(8), and neopentasilane, Si5H12, as precursor gases. By varying the relative flux of the precursors, alloys with variable chemical composition are obtained, as shown by energy dispersive x-ray analysis. Room temperature electrical resistivity measurements strongly indicate the formation of cobalt silicide and cobalt disilicide nanoclusters embedded in a carbonaceous matrix. Temperature-dependent electrical conductivity measurements show that the transport properties are governed by electron tunneling between neighboring CoSi or CoSi2 nanoclusters. In particular, by varying the metal content of the alloy, the electrical conductivity can be finely tuned from the insulating regime into the quasi-metallic tunneling coupling regime. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4790320]
引用
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页数:4
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