NIL processes and material characterization on transparent substrates for optical applications

被引:2
|
作者
Chaix, N. [1 ]
Gourgon, C. [1 ]
Perret, C. [1 ]
Decossas, S. [1 ]
Landis, S. [2 ]
Lambertini, V. G. [3 ]
Pira, N. Li [3 ]
机构
[1] CNRS, Lab Technol Microelect, F-38054 Grenoble, France
[2] CEA LETI, F-38054 Grenoble, France
[3] Centro Ric FIAT, I-10043 Trento, Italy
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2008年 / 26卷 / 06期
关键词
adhesion; nanolithography; nanostructured materials; polymers; scanning electron microscopy;
D O I
10.1116/1.2998726
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several nanoimprint lithography polymers have been investigated for optical applications. The objective was to establish which materials can be used as a permanent polymer coated on top of a glass substrate to provide nanostructures imprinted by nanoimprint lithography. 400 and 600 nm dots were realized in polystyrene, polymethylmethacrylate (PMMA), mr-I T85, and mr-I6000. The adhesion study shows that PMMA and mr-I6000 materials are the best candidates for demolding issues. Scanning electron microscopy characterization confirmed that PMMA structures are well defined, whereas dots printed in other polymers exhibit defects due to sticking issues which lead to local pattern deformation. Finally, optical characterization showed that the nonperfect profiles are a benefit in terms of light extraction. Polycarbonate sheets were also imprinted on one or two sides in order to study the influence of a double side patterning. It was also concluded that a double side imprinted device leads to an increase in the external efficiency.
引用
收藏
页码:2174 / 2178
页数:5
相关论文
共 50 条
  • [1] Optical surface analysis of transparent substrates for manufacturing applications
    Bechtler, L
    Velidandla, V
    Lane, G
    ANALYTICAL AND DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS, DEVICES, AND PROCESSES, 2003, 2003 (03): : 540 - 547
  • [2] Development of NIL processes for PV applications
    Hauser, H.
    Tucher, N.
    Tokai, K.
    Schneider, P.
    Wellens, Ch.
    Volk, A.
    Barke, S.
    Mueller, C.
    Glinsner, T.
    Blaesi, B.
    ALTERNATIVE LITHOGRAPHIC TECHNOLOGIES VII, 2015, 9423
  • [3] OPTICAL CHARACTERIZATION OF LOW-INDEX TRANSPARENT THIN-FILMS ON TRANSPARENT SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY
    GUSTIN, KM
    APPLIED OPTICS, 1987, 26 (18): : 3796 - 3802
  • [4] STUDIES ON INHOMOGENEOUS TRANSPARENT OPTICAL COATINGS ON TRANSPARENT SUBSTRATES BY SPECTROSCOPIC ELLIPSOMETRY
    CHINDAUDOM, P
    VEDAM, K
    THIN SOLID FILMS, 1993, 234 (1-2) : 439 - 442
  • [5] Transparent Optical Ceramic as a Gem Material?
    Williams, Cara
    Williams, Bear
    JOURNAL OF GEMMOLOGY, 2022, 38 (03) : 224 - 225
  • [6] Recognition Memory: Material, Processes, and Substrates
    Brown, Malcolm W.
    Warburton, E. Clea
    Aggleton, John P.
    HIPPOCAMPUS, 2010, 20 (11) : 1228 - 1244
  • [7] Light-scattering characterization of transparent substrates
    Zerrad, M
    Deumié, C
    Lecluirne, M
    Amra, C
    Ewart, M
    APPLIED OPTICS, 2006, 45 (07) : 1402 - 1409
  • [8] Synthesis, structural and optical characterization of LiNbO3 material for optical applications
    Guithi, K.
    Sekrafi, H. E.
    Kharrat, A. Ben Jazia
    Khirouni, K.
    Boujelben, W.
    JOURNAL OF OPTICS-INDIA, 2023, 52 (03): : 1494 - 1506
  • [9] Synthesis, structural and optical characterization of LiNbO3 material for optical applications
    K. Guithi
    H. E. Sekrafi
    A. Ben Jazia Kharrat
    K. Khirouni
    W. Boujelben
    Journal of Optics, 2023, 52 : 1494 - 1506
  • [10] Synthesis, growth and characterization of γ-glycine - A promising material for optical applications
    Sivakumar, N.
    Jayaramakrishnan, V.
    Baskar, K.
    Anbalagan, G.
    OPTICAL MATERIALS, 2014, 37 : 780 - 787