On the Use of the IC Stripline to Evaluate the Susceptibility to EMI of Small Integrated Circuits

被引：0

作者：

Fiori, Franco ^{[1
]}

Perotti, Michele ^{[1
]}

机构：

[1] Politecn Torino, Elect & Telecommun Dept, Turin, Italy

来源：

PROCEEDINGS OF THE 2016 INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY - EMC EUROPE | 2016年

关键词：

Integrated Circuits; Susceptibility; Radiated Immunity Test;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The IC stripline method is one of those suggested in IEC-62132 to evaluate the susceptibility of ICs to radiated electromagnetic interference. In practice, it allows the multiple injection of the interference through the capacitive and inductive coupling of the IC package with the guiding structure (the stripline) in which the device under test is inserted. The pros and cons of this method are discussed and a variant of it is proposed with the aim to address the main problems that arise when evaluating the susceptibility of ICs encapsulated in small packages.

引用

页码：306 / 309

页数：4

共 8 条

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