Charging effect of Al2O3 thin films containing Al nanocrystals

被引:14
作者
Liu, Y. [1 ,2 ]
Chen, T. P. [1 ]
Zhu, W. [1 ]
Yang, M. [1 ]
Cen, Z. H. [1 ]
Wong, J. I. [1 ]
Li, Y. B. [3 ]
Zhang, S. [4 ]
Chen, X. B. [2 ]
Fung, S. [5 ]
机构
[1] Nanyang Technol Univ, Sch Elect & Elect Engn, Singapore 639798, Singapore
[2] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devi, Chengdu 610054, Sichuan, Peoples R China
[3] Harbin Inst Technol, Sch Astronaut, Ctr Composite Mat, Harbin 150080, Peoples R China
[4] Nanyang Technol Univ, Sch Mech & Aerosp Engn, Singapore 639798, Singapore
[5] Univ Hong Kong, Dept Phys, Hong Kong, Hong Kong, Peoples R China
基金
中国国家自然科学基金; 新加坡国家研究基金会;
关键词
D O I
10.1063/1.2994695
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, Al(2)O(3) thin film containing Al nanocrystals (nc-Al) is deposited on Si substrate by radio frequency sputtering to form a metal-insulator-semiconductor structure. Both electron and hole trapping in nc-Al are observed. The charge storage ability of the nc-Al/Al(2)O(3) thin films provides the possibility of memory applications. Charging in the nc-Al also leads to a change in the dc resistance of the thin films, namely, the electron trapping in the nc-Al leads to an increase in the resistance, whereas the resistance is reduced if there is hole trapping in the nc-Al. (C) 2008 American Institute of Physics.
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页数:3
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